Yusuke MATSUNAGA

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Kawasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, diagnostic test, and diagnostic test circuit
- Patent number 10,520,549
- Issue date Dec 31, 2019
- Renesas Electronics Corporation
- Yukitoshi Tsuboi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device, diagnostic test, and diagnostic test circuit
- Patent number 9,810,738
- Issue date Nov 7, 2017
- Renesas Electronics Corporation
- Yukitoshi Tsuboi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE, DIAGNOSTIC TEST, AND DIAGNOSTIC TEST CIRCUIT
- Publication number 20180080984
- Publication date Mar 22, 2018
- RENESAS ELECTRONICS CORPORATION
- Yukitoshi TSUBOI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, DIAGNOSTIC TEST, AND DIAGNOSTIC TEST CIRCUIT
- Publication number 20150293173
- Publication date Oct 15, 2015
- RENESAS ELECTRONICS CORPORATION
- Yukitoshi TSUBOI
- G01 - MEASURING TESTING