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Yusuke MATSUURA
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Tsukuba-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Particle measuring device, calibration method, and measuring device
Patent number
11,774,340
Issue date
Oct 3, 2023
National Institute of Advanced Industrial Science and Technology
Haruhisa Kato
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Particulate observation device and particulate observation method
Patent number
11,415,500
Issue date
Aug 16, 2022
National Institute of Advanced Industrial Science and Technology
Haruhisa Kato
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Flow velocity distribution measuring method and particle size measu...
Patent number
11,280,652
Issue date
Mar 22, 2022
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Haruhisa Kato
G01 - MEASURING TESTING
Information
Patent Grant
Particle measuring device and particle measuring method
Patent number
10,837,890
Issue date
Nov 17, 2020
Rion Co., Ltd.
Kaoru Kondo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PARTICLE MEASURING DEVICE, CALIBRATION METHOD, AND MEASURING DEVICE
Publication number
20210348999
Publication date
Nov 11, 2021
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Haruhisa KATO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PARTICULATE OBSERVATION DEVICE AND PARTICULATE OBSERVATION METHOD
Publication number
20210055197
Publication date
Feb 25, 2021
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Haruhisa KATO
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE MEASURING DEVICE AND PARTICLE MEASURING METHOD
Publication number
20200124514
Publication date
Apr 23, 2020
Rion Co., Ltd.
Kaoru KONDO
G01 - MEASURING TESTING
Information
Patent Application
FLOW VELOCITY DISTRIBUTION MEASURING METHOD AND PARTICLE SIZE MEASU...
Publication number
20200064169
Publication date
Feb 27, 2020
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Haruhisa KATO
G01 - MEASURING TESTING