Yusuke MIIDA

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample measuring method and sample measurement device
- Patent number 11,327,086
- Issue date May 10, 2022
- Sysmex Corporation
- Tomoyuki Nose
- G01 - MEASURING TESTING
Information Patent Grant
Detection apparatus and detection method
- Patent number 11,099,182
- Issue date Aug 24, 2021
- Sysmex Corporation
- Kazuyoshi Horii
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
DETECTION APPARATUS AND DETECTION METHOD
- Publication number 20210148905
- Publication date May 20, 2021
- Sysmex Corporation
- Kazuyoshi HORII
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MEASURING METHOD AND SAMPLE MEASUREMENT DEVICE
- Publication number 20190162740
- Publication date May 30, 2019
- SYSMEX CORPORATION
- Tomoyuki NOSE
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT DEVICE
- Publication number 20190162670
- Publication date May 30, 2019
- SYSMEX CORPORATION
- Tomoyuki NOSE
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
DETECTION APPARATUS AND DETECTION METHOD
- Publication number 20180003704
- Publication date Jan 4, 2018
- SYSMEX CORPORATION
- Kazuyoshi HORII
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...