Yusuke Ominami

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Observation support unit for charged particle microscope and sample...
- Patent number 10,431,416
- Issue date Oct 1, 2019
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, sample observation method, sample pla...
- Patent number 10,241,062
- Issue date Mar 26, 2019
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Grant
Electron scanning microscope and image generation method
- Patent number 10,157,724
- Issue date Dec 18, 2018
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, image generation method, observation...
- Patent number 9,824,854
- Issue date Nov 21, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle-beam device, specimen-image acquisition method, an...
- Patent number 9,741,530
- Issue date Aug 22, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample image acquiring method
- Patent number 9,741,526
- Issue date Aug 22, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, method for adjusting charged particle...
- Patent number 9,673,020
- Issue date Jun 6, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diaphragm mounting member and charged particle beam device
- Patent number 9,633,817
- Issue date Apr 25, 2017
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample storage container, charged particle beam apparatus, and imag...
- Patent number 9,564,288
- Issue date Feb 7, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,543,111
- Issue date Jan 10, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample base, charged particle beam device and sample observation me...
- Patent number 9,508,527
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, sample stage unit, and sample observa...
- Patent number 9,472,375
- Issue date Oct 18, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation apparatus and optical axis adjustment method
- Patent number 9,466,457
- Issue date Oct 11, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle-beam device and specimen observation method
- Patent number 9,466,460
- Issue date Oct 11, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device and sample observation method
- Patent number 9,418,818
- Issue date Aug 16, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and filter member
- Patent number 9,373,480
- Issue date Jun 21, 2016
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample observation method
- Patent number 9,362,083
- Issue date Jun 7, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,263,232
- Issue date Feb 16, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin membrane holder for an electron microscope
- Patent number D748706
- Issue date Feb 2, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- D16 - Photography and optical equipment
Information Patent Grant
Charged particle beam device, position adjusting method for diaphra...
- Patent number 9,251,996
- Issue date Feb 2, 2016
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample observation method
- Patent number 9,240,305
- Issue date Jan 19, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection or observation apparatus and sample inspection or observ...
- Patent number 9,236,217
- Issue date Jan 12, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,208,995
- Issue date Dec 8, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, method for adjusting charged particle...
- Patent number 9,165,741
- Issue date Oct 20, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,105,442
- Issue date Aug 11, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Base of a thin membrane holder for an electron microscope
- Patent number D730962
- Issue date Jun 2, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- D16 - Photography and optical equipment
Information Patent Grant
Inspection or observation apparatus and sample inspection or observ...
- Patent number 8,933,400
- Issue date Jan 13, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,921,786
- Issue date Dec 30, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holding apparatus for electron microscope, and electron micr...
- Patent number 8,835,847
- Issue date Sep 16, 2014
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,710,439
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OBSERVATION SUPPORT UNIT FOR CHARGED PARTICLE MICROSCOPE AND SAMPLE...
- Publication number 20190013177
- Publication date Jan 10, 2019
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD
- Publication number 20180122617
- Publication date May 3, 2018
- Hitachi High-Technologies Corporation
- Shinsuke KAWANISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle-Beam Device, Specimen-Image Acquisition Method, an...
- Publication number 20160336145
- Publication date Nov 17, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, IMAGE GENERATION METHOD, OBSERVATION...
- Publication number 20160329188
- Publication date Nov 10, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus and Sample Image Acquiring Method
- Publication number 20160203944
- Publication date Jul 14, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Diaphragm Mounting Member and Charged Particle Beam Device
- Publication number 20160203941
- Publication date Jul 14, 2016
- HITACHI-TECHNOLOGIES CORPORATION
- Shinsuke KAWANISHI
- G01 - MEASURING TESTING
Information Patent Application
Charged-Particle-Beam Device and Specimen Observation Method
- Publication number 20160126058
- Publication date May 5, 2016
- Hitach Hight-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Filter Member
- Publication number 20160071685
- Publication date Mar 10, 2016
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device, Sample Observation Method, Sample Pla...
- Publication number 20160025659
- Publication date Jan 28, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE...
- Publication number 20150380208
- Publication date Dec 31, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Base, Charged Particle Beam Device and Sample Observation Me...
- Publication number 20150318143
- Publication date Nov 5, 2015
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device, Sample Stage Unit, and Sample Observa...
- Publication number 20150311033
- Publication date Oct 29, 2015
- HITACHI HIGH-TECHNOLOGY CORPORATION
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Storage Container, Charged Particle Beam Apparatus, and Imag...
- Publication number 20150255244
- Publication date Sep 10, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20150235803
- Publication date Aug 20, 2015
- Hitachi High-Technologies Corpration
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Observation Apparatus and Optical Axis Adjustment Method
- Publication number 20150228448
- Publication date Aug 13, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device, Position Adjusting Method for Diaphra...
- Publication number 20150228449
- Publication date Aug 13, 2015
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20150228447
- Publication date Aug 13, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus and Sample Observation Method
- Publication number 20150221470
- Publication date Aug 6, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20150213999
- Publication date Jul 30, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMBER FOR CHARGED PARTICLE BEAM DEVICE, CHARGED PARTICLE BEAM DEVI...
- Publication number 20150206705
- Publication date Jul 23, 2015
- Hitachi High-Technologies Corporation
- Noriyuki Sakuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20150129763
- Publication date May 14, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...
- Publication number 20150083908
- Publication date Mar 26, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150076347
- Publication date Mar 19, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150014530
- Publication date Jan 15, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...
- Publication number 20140246583
- Publication date Sep 4, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140175278
- Publication date Jun 26, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE...
- Publication number 20140151553
- Publication date Jun 5, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDING APPARATUS FOR ELECTRON MICROSCOPE, AND ELECTRON MICR...
- Publication number 20140042318
- Publication date Feb 13, 2014
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140021347
- Publication date Jan 23, 2014
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20130313430
- Publication date Nov 28, 2013
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS

Yusuke Ominami

Person

Patents Grantslast 30 patents

Observation support unit for charged particle microscope and sample...

Charged particle beam device, sample observation method, sample pla...

Electron scanning microscope and image generation method

Charged particle beam device, image generation method, observation...

Charged-particle-beam device, specimen-image acquisition method, an...

Charged particle beam apparatus and sample image acquiring method

Charged particle beam device, method for adjusting charged particle...

Diaphragm mounting member and charged particle beam device

Sample storage container, charged particle beam apparatus, and imag...

Charged particle beam device

Sample base, charged particle beam device and sample observation me...

Charged particle beam device, sample stage unit, and sample observa...

Observation apparatus and optical axis adjustment method

Charged particle-beam device and specimen observation method

Charged particle beam device and sample observation method

Charged particle beam device and filter member

Charged particle beam apparatus and sample observation method

Charged particle beam device

Thin membrane holder for an electron microscope

Charged particle beam device, position adjusting method for diaphra...

Charged particle beam device and sample observation method

Inspection or observation apparatus and sample inspection or observ...

Charged particle beam apparatus

Charged particle beam device, method for adjusting charged particle...

Charged particle beam apparatus

Base of a thin membrane holder for an electron microscope

Inspection or observation apparatus and sample inspection or observ...

Charged particle beam apparatus

Sample holding apparatus for electron microscope, and electron micr...

Charged particle beam apparatus

Patents Applicationslast 30 patents

OBSERVATION SUPPORT UNIT FOR CHARGED PARTICLE MICROSCOPE AND SAMPLE...

ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD

Charged-Particle-Beam Device, Specimen-Image Acquisition Method, an...

CHARGED PARTICLE BEAM DEVICE, IMAGE GENERATION METHOD, OBSERVATION...

Charged Particle Beam Apparatus and Sample Image Acquiring Method

Diaphragm Mounting Member and Charged Particle Beam Device

Charged-Particle-Beam Device and Specimen Observation Method

Charged Particle Beam Device and Filter Member

Charged Particle Beam Device, Sample Observation Method, Sample Pla...

CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE...

Sample Base, Charged Particle Beam Device and Sample Observation Me...

Charged Particle Beam Device, Sample Stage Unit, and Sample Observa...

Sample Storage Container, Charged Particle Beam Apparatus, and Imag...

Charged Particle Beam Device and Sample Observation Method

Observation Apparatus and Optical Axis Adjustment Method

Charged Particle Beam Device, Position Adjusting Method for Diaphra...

Charged Particle Beam Device and Sample Observation Method

Charged Particle Beam Apparatus and Sample Observation Method

Charged Particle Beam Apparatus

MEMBER FOR CHARGED PARTICLE BEAM DEVICE, CHARGED PARTICLE BEAM DEVI...

Charged Particle Beam Device

INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE...

SAMPLE HOLDING APPARATUS FOR ELECTRON MICROSCOPE, AND ELECTRON MICR...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE