Yusuke SEKI

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Tokyo, JP

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Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device and Scan Waveform Generation Method
- Publication number 20230260739
- Publication date Aug 17, 2023
- Hitachi High-Tech Corporation
- Keisuke TANUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20230197400
- Publication date Jun 22, 2023
- Hitachi High-Tech Corporation
- Yusuke SEKI
- H01 - BASIC ELECTRIC ELEMENTS