Yusuke TAGAWA

Person

Kyoto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Parameter-searching method, parameter-searching device, and program...
- Patent number 12,106,233
- Issue date Oct 1, 2024
- Shimadzu Corporation
- Yusuke Tagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Production method of learned model, brightness adjustment method, a...
- Patent number 12,067,699
- Issue date Aug 20, 2024
- Shimadzu Corporation
- Wataru Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass spectrometer and program for mass spectrometer
- Patent number 11,961,727
- Issue date Apr 16, 2024
- Shimadzu Corporation
- Yuki Ishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 11,942,314
- Issue date Mar 26, 2024
- Shimadzu Corporation
- Yusuke Tagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 11,942,313
- Issue date Mar 26, 2024
- Shimadzu Corporation
- Yusuke Tagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic image processing device for head mounted display, dynamic i...
- Patent number 10,948,728
- Issue date Mar 16, 2021
- Shimadzu Corporation
- Yusuke Tagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Digital holography device and digital hologram generation method
- Patent number 10,281,877
- Issue date May 7, 2019
- Shimadzu Corporation
- Yusuke Tagawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Radiation inspecting apparatus
- Patent number 9,606,072
- Issue date Mar 28, 2017
- Shimadzu Corporation
- Yusuke Tagawa
- G01 - MEASURING TESTING
Information Patent Grant
Radiographic apparatus and an image processing method therefore
- Patent number 9,476,844
- Issue date Oct 25, 2016
- Shimadzu Corporation
- Yusuke Tagawa
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CONSECUTIVE APPROXIMATION CALCULATION METHOD, CONSECUTIVE APPROXIMA...
- Publication number 20220253508
- Publication date Aug 11, 2022
- SHIMADZU CORPORATION
- Yusuke TAGAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASS SPECTROMETER AND PROGRAM FOR MASS SPECTROMETER
- Publication number 20220238318
- Publication date Jul 28, 2022
- SHIMADZU CORPORATION
- Yuki ISHIKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20220216042
- Publication date Jul 7, 2022
- SHIMADZU CORPORATION
- Yusuke TAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20220199382
- Publication date Jun 23, 2022
- SHIMADZU CORPORATION
- Yusuke TAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRODUCTION METHOD OF LEARNED MODEL, BRIGHTNESS ADJUSTMENT METHOD, A...
- Publication number 20210350513
- Publication date Nov 11, 2021
- SHIMADZU CORPORATION
- Wataru TAKAHASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image Reproduction Method and Image Analysis Apparatus
- Publication number 20210232090
- Publication date Jul 29, 2021
- Shimadzu Corporation
- Yusuke TAGAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARAMETER-SEARCHING METHOD, PARAMETER-SEARCHING DEVICE, AND PROGRAM...
- Publication number 20210089952
- Publication date Mar 25, 2021
- SHIMADZU CORPORATION
- Yusuke TAGAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC IMAGE PROCESSING DEVICE FOR HEAD MOUNTED DISPLAY, DYNAMIC I...
- Publication number 20170343823
- Publication date Nov 30, 2017
- SHIMADZU CORPORATION
- Yusuke TAGAWA
- G02 - OPTICS
Information Patent Application
DIGITAL HOLOGRAPHY DEVICE AND DIGITAL HOLOGRAM GENERATION METHOD
- Publication number 20170329281
- Publication date Nov 16, 2017
- Shimadzu Corporation
- YUSUKE TAGAWA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
RADIATION INSPECTING APPARATUS
- Publication number 20160363544
- Publication date Dec 15, 2016
- Shimadzu Corporation
- Yusuke TAGAWA
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC APPARATUS AND AN IMAGE PROCESSING METHOD THEREFORE
- Publication number 20140205058
- Publication date Jul 24, 2014
- Shimadzu Corporation
- Yusuke TAGAWA
- G01 - MEASURING TESTING

Yusuke TAGAWA

Person

Patents Grantslast 30 patents

Parameter-searching method, parameter-searching device, and program...

Production method of learned model, brightness adjustment method, a...

Mass spectrometer and program for mass spectrometer

Mass spectrometer and mass spectrometry method

Mass spectrometer and mass spectrometry method

Dynamic image processing device for head mounted display, dynamic i...

Digital holography device and digital hologram generation method

Radiation inspecting apparatus

Radiographic apparatus and an image processing method therefore

Patents Applicationslast 30 patents

CONSECUTIVE APPROXIMATION CALCULATION METHOD, CONSECUTIVE APPROXIMA...

MASS SPECTROMETER AND PROGRAM FOR MASS SPECTROMETER

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

PRODUCTION METHOD OF LEARNED MODEL, BRIGHTNESS ADJUSTMENT METHOD, A...

Image Reproduction Method and Image Analysis Apparatus

PARAMETER-SEARCHING METHOD, PARAMETER-SEARCHING DEVICE, AND PROGRAM...

DYNAMIC IMAGE PROCESSING DEVICE FOR HEAD MOUNTED DISPLAY, DYNAMIC I...

DIGITAL HOLOGRAPHY DEVICE AND DIGITAL HOLOGRAM GENERATION METHOD

RADIATION INSPECTING APPARATUS

RADIOGRAPHIC APPARATUS AND AN IMAGE PROCESSING METHOD THEREFORE