Yuta IMAI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device and axis adjustment method thereof
- Patent number 12,027,342
- Issue date Jul 2, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuta Imai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,823,861
- Issue date Nov 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuta Imai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reading apparatus
- Patent number 11,797,791
- Issue date Oct 24, 2023
- NEC Platforms, Ltd.
- Hideki Matsuura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device and axis adjustment method thereof
- Patent number 11,764,028
- Issue date Sep 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuta Imai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and method for adjusting position of d...
- Patent number 11,342,155
- Issue date May 24, 2022
- HITACHI HIGH-TECH CORPORATION
- Yuta Imai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,264,201
- Issue date Mar 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Kazuo Ootsuga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam device
- Patent number 10,014,151
- Issue date Jul 3, 2018
- Hitachi High-Technologies Corporation
- Yuta Imai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun, charged particle gun, and charged particle beam appar...
- Patent number 9,570,268
- Issue date Feb 14, 2017
- Hitachi High-Technologies Corporation
- Yuta Imai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE IMAGE OBSERVATION DEVICE AND METHOD
- Publication number 20240222065
- Publication date Jul 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Axis Adjustment Method Thereof
- Publication number 20230377829
- Publication date Nov 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLEARANCE CALCULATION DEVICE AND CLEARANCE CALCULATION METHOD
- Publication number 20230315950
- Publication date Oct 5, 2023
- Mitsubishi Heavy Industries, Ltd.
- Satoshi Kumagai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE IMAGE OBSERVATION DEVICE AND METHOD FOR SAME
- Publication number 20230230799
- Publication date Jul 20, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
READING APPARATUS
- Publication number 20220269873
- Publication date Aug 25, 2022
- NEC Platforms Ltd.
- Hideki MATSUURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220254597
- Publication date Aug 11, 2022
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Method for Adjusting Position of D...
- Publication number 20210296081
- Publication date Sep 23, 2021
- Hitachi High-Tech Corporation
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20210217580
- Publication date Jul 15, 2021
- HITACHI HIGH-TECH CORPORATION
- Kazuo OOTSUGA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Axis Adjustment Method Thereof
- Publication number 20210151279
- Publication date May 20, 2021
- Hitachi High-Tech Corporation
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STORAGE MEDIUM, RENDERING METHOD AND DATA STRUCTURE
- Publication number 20180300935
- Publication date Oct 18, 2018
- LIVE2D INC.
- Yuta IMAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM DEVICE
- Publication number 20180025885
- Publication date Jan 25, 2018
- Hitachi High-Technologies Corporation
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN, CHARGED PARTICLE GUN, AND CHARGED PARTICLE BEAM APPAR...
- Publication number 20160104597
- Publication date Apr 14, 2016
- Hitachi High-Technologies Corporation
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Charged particle beam device and axis adjustment method thereof

Charged particle beam device

Reading apparatus

Charged particle beam device and axis adjustment method thereof

Charged particle beam device and method for adjusting position of d...

Charged particle beam device

Composite charged particle beam device

Electron gun, charged particle gun, and charged particle beam appar...

Patents Applicationslast 30 patents

SAMPLE IMAGE OBSERVATION DEVICE AND METHOD

Charged Particle Beam Device and Axis Adjustment Method Thereof

CLEARANCE CALCULATION DEVICE AND CLEARANCE CALCULATION METHOD

SAMPLE IMAGE OBSERVATION DEVICE AND METHOD FOR SAME

READING APPARATUS

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam Device and Method for Adjusting Position of D...

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam Device and Axis Adjustment Method Thereof

STORAGE MEDIUM, RENDERING METHOD AND DATA STRUCTURE

COMPOSITE CHARGED PARTICLE BEAM DEVICE

ELECTRON GUN, CHARGED PARTICLE GUN, AND CHARGED PARTICLE BEAM APPAR...