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Tokyo, JP
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last 30 patents
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Patent Grant
Contact probe and socket for testing electrical component
Patent number
11,841,380
Issue date
Dec 12, 2023
Enplas Corporation
Inoue Yuta
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Contact probe and socket for testing electrical component
Publication number
20220317153
Publication date
Oct 6, 2022
Enplas Corporation
Inoue YUTA
G01 - MEASURING TESTING
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Patent Application
METHOD OF PROVIDING CONTENTS, PROGRAM FOR EXECUTING THE METHOD ON C...
Publication number
20180373884
Publication date
Dec 27, 2018
COLOPL, INC.
Yuta INOUE
G06 - COMPUTING CALCULATING COUNTING