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Yuta KAWAMOTO

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Charged particle beam apparatus
    • Patent number 11,791,124
    • Issue date Oct 17, 2023
    • Hitachi High-Technologies Corporation
    • Yuta Kawamoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam apparatus
    • Patent number 11,784,023
    • Issue date Oct 10, 2023
    • Hitachi High-Technologies Corporation
    • Yuta Kawamoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Beam irradiation device
    • Patent number 11,239,042
    • Issue date Feb 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akira Ikegami
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam device and electrostatic lens
    • Patent number 11,201,033
    • Issue date Dec 14, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yuta Kawamoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam application apparatus
    • Patent number 11,177,108
    • Issue date Nov 16, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yasuhiro Shirasaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged-particle beam device
    • Patent number 11,056,310
    • Issue date Jul 6, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yuta Kawamoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Beam irradiation device
    • Patent number 10,832,886
    • Issue date Nov 10, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Akira Ikegami
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Scanning electron microscope
    • Patent number 10,559,450
    • Issue date Feb 11, 2020
    • Hitachi High-Technologies Corporation
    • Noritsugu Takahashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam device
    • Patent number 10,304,654
    • Issue date May 28, 2019
    • Hitachi High-Technologies Corporation
    • Akira Ikegami
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    PHOTOELECTRON EMISSION MICROSCOPE
    • Publication number 20250020604
    • Publication date Jan 16, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Momoyo ENYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Charged Particle Beam Apparatus
    • Publication number 20210398770
    • Publication date Dec 23, 2021
    • Hitachi High-Technologies Corporation
    • Yuta KAWAMOTO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Apparatus
    • Publication number 20210233738
    • Publication date Jul 29, 2021
    • Yuta Kawamoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Beam Irradiation Device
    • Publication number 20210027976
    • Publication date Jan 28, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akira IKEGAMI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM APPLICATION APPARATUS
    • Publication number 20210005417
    • Publication date Jan 7, 2021
    • Hitachi High-Tech Corporation
    • Yasuhiro Shirasaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Apparatus
    • Publication number 20200294757
    • Publication date Sep 17, 2020
    • Hitachi High-Technologies Corporation
    • Yuta KAWAMOTO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device and Electrostatic Lens
    • Publication number 20200185186
    • Publication date Jun 11, 2020
    • Hitachi High-Technologies Corporation
    • Yuta KAWAMOTO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged-Particle Beam Device
    • Publication number 20190393014
    • Publication date Dec 26, 2019
    • Hitachi High-Technologies Corporation
    • Yuta KAWAMOTO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Beam Irradiation Device
    • Publication number 20190287754
    • Publication date Sep 19, 2019
    • Hitachi High-Technologies Corporation
    • Akira IKEGAMI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20190074159
    • Publication date Mar 7, 2019
    • Hitachi High-Technologies Corporation
    • Noritsugu Takahashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20180233320
    • Publication date Aug 16, 2018
    • Hitachi High-Technologies Corporation
    • Akira IKEGAMI
    • H01 - BASIC ELECTRIC ELEMENTS