Yuta URANO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection device and inspection method, and optical module
- Patent number 12,025,569
- Issue date Jul 2, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection device, defect detection method, and defect observ...
- Patent number 11,982,631
- Issue date May 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring device, distance measuring method, and three-dim...
- Patent number 11,644,545
- Issue date May 9, 2023
- Hitachi, Ltd.
- Kenji Maruno
- G02 - OPTICS
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 11,143,598
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and pattern chip
- Patent number 10,955,361
- Issue date Mar 23, 2021
- HITACHI HIGH-TECH CORPORATION
- Yuta Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device, pattern chip, and defect inspection method
- Patent number 10,948,424
- Issue date Mar 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Yuta Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 10,830,706
- Issue date Nov 10, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection method and X-ray inspection device
- Patent number 10,823,686
- Issue date Nov 3, 2020
- Hitachi High-Tech Science Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Projection control apparatus and control method thereof, and projec...
- Patent number 10,663,844
- Issue date May 26, 2020
- Canon Kabushiki Kaisha
- Yuta Urano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect observation method and device and defect detection device
- Patent number 10,401,300
- Issue date Sep 3, 2019
- Hitachi High-Technologies Corporation
- Yuko Otani
- G02 - OPTICS
Information Patent Grant
X-ray inspection method and device
- Patent number 10,352,879
- Issue date Jul 16, 2019
- Hitachi High-Technologies Corporaiton
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method, low light detecting method, and low light...
- Patent number 10,261,026
- Issue date Apr 16, 2019
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting method and defect inspecting apparatus
- Patent number 10,254,235
- Issue date Apr 9, 2019
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 10,228,332
- Issue date Mar 12, 2019
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting method and defect inspecting apparatus
- Patent number 9,841,384
- Issue date Dec 12, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for observing defects
- Patent number 9,773,641
- Issue date Sep 26, 2017
- Hitachi High-Technologies Corporation
- Yuko Otani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reviewing a defect and apparatus
- Patent number 9,733,194
- Issue date Aug 15, 2017
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting defects
- Patent number 9,678,021
- Issue date Jun 13, 2017
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 9,645,094
- Issue date May 9, 2017
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and device using same
- Patent number 9,606,071
- Issue date Mar 28, 2017
- Hitachi High-Technologies Corporation
- Yukihiro Shibata
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Defect inspection method, low light detecting method and low light...
- Patent number 9,588,054
- Issue date Mar 7, 2017
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 9,588,055
- Issue date Mar 7, 2017
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 9,568,439
- Issue date Feb 14, 2017
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 9,523,648
- Issue date Dec 20, 2016
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 9,506,872
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection device, inspection method, and X-ray detector
- Patent number 9,506,876
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and device for same
- Patent number 9,488,596
- Issue date Nov 8, 2016
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and defect inspection device
- Patent number 9,470,640
- Issue date Oct 18, 2016
- Hitachi High-Technologies Corporation
- Shunichi Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 9,329,136
- Issue date May 3, 2016
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and device using same
- Patent number 9,329,137
- Issue date May 3, 2016
- Hitachi High-Technologies Corporation
- Yukihiro Shibata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
- Publication number 20240230551
- Publication date Jul 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
- Publication number 20240133824
- Publication date Apr 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE
- Publication number 20240096667
- Publication date Mar 21, 2024
- Hitachi High-Tech Corporation
- Hiromichi YAMAKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMMUNICATION DEVICE, COMMUNICATION CONTROL METHOD, AND STORAGE MEDIUM
- Publication number 20230386328
- Publication date Nov 30, 2023
- Canon Kabushiki Kaisha
- YUTA URANO
- G08 - SIGNALLING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, MOVABLE APPARA...
- Publication number 20230377310
- Publication date Nov 23, 2023
- Canon Kabushiki Kaisha
- Shin TANAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20230175978
- Publication date Jun 8, 2023
- Hitachi High-Tech Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, CONTROL METHOD, AND NON-TRANSITORY C...
- Publication number 20230100249
- Publication date Mar 30, 2023
- Canon Kabushiki Kaisha
- Yuta Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20220291140
- Publication date Sep 15, 2022
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, AND DEFECT OBSERV...
- Publication number 20220155240
- Publication date May 19, 2022
- Hitachi High-Tech Corporation
- Yuko Otani
- G02 - OPTICS
Information Patent Application
DEFECT INSPECTION DEVICE AND INSPECTION METHOD, AND OPTICAL MODULE
- Publication number 20220074868
- Publication date Mar 10, 2022
- Hitachi High-Tech Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20210025829
- Publication date Jan 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20200256804
- Publication date Aug 13, 2020
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND PATTERN CHIP
- Publication number 20200182804
- Publication date Jun 11, 2020
- Hitachi High-Technologies Corporation
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASURING DEVICE, DISTANCE MEASURING METHOD, AND THREE-DIM...
- Publication number 20200018823
- Publication date Jan 16, 2020
- Hitachi, Ltd
- Kenji MARUNO
- G01 - MEASURING TESTING
Information Patent Application
PROJECTION CONTROL APPARATUS AND PROJECTION CONTROL METHOD
- Publication number 20190327457
- Publication date Oct 24, 2019
- Canon Kabushiki Kaisha
- Yuta Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL APPARATUS, READABLE MEDIUM, AND CONTROL METHOD
- Publication number 20190281266
- Publication date Sep 12, 2019
- Canon Kabushiki Kaisha
- Yuta Urano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PROJECTION CONTROL APPARATUS AND CONTROL METHOD THEREOF, AND PROJEC...
- Publication number 20190191134
- Publication date Jun 20, 2019
- Canon Kabushiki Kaisha
- Yuta Urano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEFECT INSPECTION DEVICE, PATTERN CHIP, AND DEFECT INSPECTION METHOD
- Publication number 20190107498
- Publication date Apr 11, 2019
- Hitachi High-Technologies Corporation
- Yuta URANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION METHOD AND X-RAY INSPECTION DEVICE
- Publication number 20180202947
- Publication date Jul 19, 2018
- Hitachi High-Tech Science Corporation
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTING METHOD AND DEFECT INSPECTING APPARATUS
- Publication number 20180067060
- Publication date Mar 8, 2018
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION METHOD AND DEVICE
- Publication number 20170261441
- Publication date Sep 14, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Device and Defect Inspection Method
- Publication number 20170146463
- Publication date May 25, 2017
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD, LOW LIGHT DETECTING METHOD, AND LOW LIGHT...
- Publication number 20170115231
- Publication date Apr 27, 2017
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
DEFECT OBSERVATION METHOD AND DEVICE AND DEFECT DETECTION DEVICE
- Publication number 20170108444
- Publication date Apr 20, 2017
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G02 - OPTICS
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20170102339
- Publication date Apr 13, 2017
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEVICE USING SAME
- Publication number 20160305893
- Publication date Oct 20, 2016
- Hitachi High-Technologies Corporation
- Yukihiro SHIBATA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20160216217
- Publication date Jul 28, 2016
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE
- Publication number 20160161422
- Publication date Jun 9, 2016
- Hitachi High-Technologies Corporation
- Shunichi MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTING METHOD AND DEFECT INSPECTING APPARATUS
- Publication number 20160116421
- Publication date Apr 28, 2016
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEVICE FOR SAME
- Publication number 20160109382
- Publication date Apr 21, 2016
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Defect inspection device and inspection method, and optical module

Defect detection device, defect detection method, and defect observ...

Distance measuring device, distance measuring method, and three-dim...

Defect inspection apparatus and defect inspection method

Defect inspection apparatus and pattern chip

Defect inspection device, pattern chip, and defect inspection method

Defect inspection apparatus and defect inspection method

X-ray inspection method and X-ray inspection device

Projection control apparatus and control method thereof, and projec...

Defect observation method and device and defect detection device

X-ray inspection method and device

Defect inspection method, low light detecting method, and low light...

Defect inspecting method and defect inspecting apparatus

Defect inspection device and defect inspection method

Defect inspecting method and defect inspecting apparatus

Method and apparatus for observing defects

Method for reviewing a defect and apparatus

Method and apparatus for inspecting defects

Defect inspection device and defect inspection method

Defect inspection method and device using same

Defect inspection method, low light detecting method and low light...

Defect inspection apparatus and defect inspection method

Defect inspection device and defect inspection method

Defect inspection device and defect inspection method

Inspection apparatus

X-ray inspection device, inspection method, and X-ray detector

Defect inspection method and device for same

Defect inspection method and defect inspection device

Defect inspection device and defect inspection method

Defect inspection method and device using same

Patents Applicationslast 30 patents

DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...

DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...

DEFECT INSPECTION DEVICE

COMMUNICATION DEVICE, COMMUNICATION CONTROL METHOD, AND STORAGE MEDIUM

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, MOVABLE APPARA...

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

INFORMATION PROCESSING DEVICE, CONTROL METHOD, AND NON-TRANSITORY C...

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, AND DEFECT OBSERV...

DEFECT INSPECTION DEVICE AND INSPECTION METHOD, AND OPTICAL MODULE

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DEFECT INSPECTION APPARATUS AND PATTERN CHIP

DISTANCE MEASURING DEVICE, DISTANCE MEASURING METHOD, AND THREE-DIM...

PROJECTION CONTROL APPARATUS AND PROJECTION CONTROL METHOD

CONTROL APPARATUS, READABLE MEDIUM, AND CONTROL METHOD

PROJECTION CONTROL APPARATUS AND CONTROL METHOD THEREOF, AND PROJEC...

DEFECT INSPECTION DEVICE, PATTERN CHIP, AND DEFECT INSPECTION METHOD

X-RAY INSPECTION METHOD AND X-RAY INSPECTION DEVICE

DEFECT INSPECTING METHOD AND DEFECT INSPECTING APPARATUS

X-RAY INSPECTION METHOD AND DEVICE

Defect Inspection Device and Defect Inspection Method

DEFECT INSPECTION METHOD, LOW LIGHT DETECTING METHOD, AND LOW LIGHT...

DEFECT OBSERVATION METHOD AND DEVICE AND DEFECT DETECTION DEVICE

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

DEFECT INSPECTION METHOD AND DEVICE USING SAME

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE

DEFECT INSPECTING METHOD AND DEFECT INSPECTING APPARATUS

DEFECT INSPECTION METHOD AND DEVICE FOR SAME