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Yutaka Dejima
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Kyoto-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Specimen analysis apparatus
Patent number
11,087,876
Issue date
Aug 10, 2021
Horiba, Ltd.
Yutaka Dejima
G01 - MEASURING TESTING
Information
Patent Grant
Analyzing device
Patent number
9,176,046
Issue date
Nov 3, 2015
HORIBA, Ltd.
Kimihiko Arimoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
TEST ORDER PROCESSING APPARATUS, COMPUTER PROGRAM THEREFOR AND TEST...
Publication number
20190244695
Publication date
Aug 8, 2019
HORIBA, Ltd.
Yutaka Dejima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPECIMEN ANALYSIS APPARATUS
Publication number
20190019580
Publication date
Jan 17, 2019
HORIBA, Ltd.
Yutaka Dejima
G01 - MEASURING TESTING
Information
Patent Application
EXAMINATION ORDER PROCESSING DEVICE AND EXAMINATION SYSTEM USING SAME
Publication number
20180350450
Publication date
Dec 6, 2018
HORIBA, LTD.
Yutaka Dejima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ANALYZING DEVICE
Publication number
20140300894
Publication date
Oct 9, 2014
HORIBA, Ltd.
Kimihiko Arimoto
G01 - MEASURING TESTING