Yutaka Ichihara

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Display apparatus and display method
- Patent number 8,933,878
- Issue date Jan 13, 2015
- Nikon Corporation
- Yoshikazu Sugiyama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image processing apparatus, image processing method, recording meth...
- Patent number 8,791,989
- Issue date Jul 29, 2014
- Nikon Corporation
- Yoshijiro Ushio
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image processing apparatus, image processing method, recording meth...
- Patent number 8,675,048
- Issue date Mar 18, 2014
- Nikon Corporation
- Yoshijiro Ushio
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Projection optical system inspecting method and inspection apparatu...
- Patent number 7,868,997
- Issue date Jan 11, 2011
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Projection optical system inspecting method and inspection apparatu...
- Patent number 7,843,550
- Issue date Nov 30, 2010
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for point diffraction interferometry
- Patent number 6,963,408
- Issue date Nov 8, 2005
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Exposure apparatus and methods utilizing plural mask and object sta...
- Patent number 6,894,763
- Issue date May 17, 2005
- Nikon Corporation
- Seiro Murakami
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multilayer-film reflective mirrors, extreme UV microlithography app...
- Patent number 6,522,716
- Issue date Feb 18, 2003
- Nikon Corporation
- Katsuhiko Murakami
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Projection exposure apparatus and method
- Patent number 6,362,926
- Issue date Mar 26, 2002
- Nikon Corporation
- Yasuhiro Omura
- G02 - OPTICS
Information Patent Grant
Projection exposure apparatus and method
- Patent number 6,195,213
- Issue date Feb 27, 2001
- Nikon Corporation
- Yasuhiro Omura
- G02 - OPTICS
Information Patent Grant
Catadioptric reduction projection optical system and method
- Patent number 6,118,596
- Issue date Sep 12, 2000
- Nikon Corporation
- Sumio Hashimoto
- G02 - OPTICS
Information Patent Grant
Catadioptric reduction projection optical system and method
- Patent number 6,108,140
- Issue date Aug 22, 2000
- Nikon Corporation
- Sumio Hashimoto
- G02 - OPTICS
Information Patent Grant
Cata-dioptric reduction projection optical system
- Patent number RE36740
- Issue date Jun 20, 2000
- Nikon Corporation
- Yutaka Ichihara
- 359 - Optical: systems and elements
Information Patent Grant
Apparatus and methods for measuring wavefront aberrations of a micr...
- Patent number 5,898,501
- Issue date Apr 27, 1999
- Nikon Corporation
- Jun Suzuki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Catadioptric reduction projection optical system
- Patent number 5,844,728
- Issue date Dec 1, 1998
- Nikon Corporation
- Sumio Hashimoto
- G02 - OPTICS
Information Patent Grant
Projection optical apparatus for projecting a mask pattern onto the...
- Patent number 5,793,473
- Issue date Aug 11, 1998
- Nikon Corporation
- Motoo Koyama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Exposure apparatus for reproducing a mask pattern onto a photo-sens...
- Patent number 5,774,240
- Issue date Jun 30, 1998
- Nikon Corporation
- Akihiro Goto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Catadioptric reduction projection optical system
- Patent number 5,712,735
- Issue date Jan 27, 1998
- Nikon Corporation
- Sumio Hashimoto
- G02 - OPTICS
Information Patent Grant
Method and apparatus for manufacturing a diffraction grating zone p...
- Patent number 5,623,473
- Issue date Apr 22, 1997
- Nikon Corporation
- Yutaka Ichihara
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Interferometric surface profiler with an alignment optical member
- Patent number 5,563,706
- Issue date Oct 8, 1996
- Nikon Corporation
- Masato Shibuya
- G01 - MEASURING TESTING
Information Patent Grant
Exposure apparatus for reproducing a mask pattern onto a photo-sens...
- Patent number 5,528,390
- Issue date Jun 18, 1996
- Nikon Corporation
- Akihiro Goto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Exposure method and apparatus using holographic techniques
- Patent number 5,504,596
- Issue date Apr 2, 1996
- Nikon Corporation
- Akihiro Goto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Video clock signal generator in an optical scanner in which a mask...
- Patent number 5,446,556
- Issue date Aug 29, 1995
- Nikon Corporation
- Yoshinori Kuroiwa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Illuminating optical apparatus
- Patent number 5,307,207
- Issue date Apr 26, 1994
- Nikon Corporation
- Yutaka Ichihara
- G02 - OPTICS
Information Patent Grant
Catadioptric reduction projection optical system
- Patent number 5,289,312
- Issue date Feb 22, 1994
- Nikon Corporation
- Sumio Hashimoto
- G02 - OPTICS
Information Patent Grant
Illumination optical arrangement
- Patent number 5,253,110
- Issue date Oct 12, 1993
- Nikon Corporation
- Yutaka Ichihara
- G02 - OPTICS
Information Patent Grant
Catadioptric reduction projection optical system
- Patent number 5,251,070
- Issue date Oct 5, 1993
- Nikon Corporation
- Sumio Hashimoto
- G02 - OPTICS
Information Patent Grant
Cata-dioptric reduction projection optical system
- Patent number 5,220,454
- Issue date Jun 15, 1993
- Nikon Corporation
- Yutaka Ichihara
- G02 - OPTICS
Information Patent Grant
Laser beam harmonics generator and light exposing device
- Patent number 5,198,837
- Issue date Mar 30, 1993
- Nikon Corporation
- Shoji Ikshizaka
- G02 - OPTICS
Information Patent Grant
Position detection apparatus
- Patent number RE34010
- Issue date Jul 28, 1992
- Nikon Corporation
- Nobutaka Magome
- 356 - Optics: measuring and testing

Patents Applicationslast 30 patents

Information Patent Application
DISPLAY APPARATUS AND DISPLAY METHOD
- Publication number 20120274556
- Publication date Nov 1, 2012
- Nikon Corporation
- Yoshikazu Suglyama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGE DISPLAY APPARATUS AND IMAGE DISPLAY METHOD
- Publication number 20120194905
- Publication date Aug 2, 2012
- Nikon Corporation
- Yoshijiro USHIO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, RECORDING METH...
- Publication number 20110310097
- Publication date Dec 22, 2011
- Nikon Corporation
- Yoshijiro USHIO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, RECORDING METH...
- Publication number 20110273543
- Publication date Nov 10, 2011
- Nikon Corporation
- Yoshijiro USHIO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Exposure Method and Apparatus, and Electronic Device Manufacturing...
- Publication number 20090011368
- Publication date Jan 8, 2009
- Yutaka Ichihara
- G02 - OPTICS
Information Patent Application
Projection optical system inspecting method and inspection apparatu...
- Publication number 20070076181
- Publication date Apr 5, 2007
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Application
Projection optical system inspecting method and inspection apparatu...
- Publication number 20060176457
- Publication date Aug 10, 2006
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for point diffraction interferometry
- Publication number 20040252311
- Publication date Dec 16, 2004
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Application
Projection eposure apparatus and method
- Publication number 20040070852
- Publication date Apr 15, 2004
- Nikon Corporation
- Yasuhiro Omura
- G02 - OPTICS
Information Patent Application
Exposure apparatus and methods utilizing plural mask and object sta...
- Publication number 20030218730
- Publication date Nov 27, 2003
- NIKON CORPORATION
- Seiro Murakami
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Interferometer system and method of manufacturing projection optica...
- Publication number 20030215053
- Publication date Nov 20, 2003
- Nikon Corporation
- Yutaka Ichihara
- G01 - MEASURING TESTING
Information Patent Application
Catadioptric reduction projection optical system
- Publication number 20010024330
- Publication date Sep 27, 2001
- Sumio Hashimoto
- G02 - OPTICS

Yutaka Ichihara

Person

Patents Grantslast 30 patents

Display apparatus and display method

Image processing apparatus, image processing method, recording meth...

Image processing apparatus, image processing method, recording meth...

Projection optical system inspecting method and inspection apparatu...

Projection optical system inspecting method and inspection apparatu...

Method and apparatus for point diffraction interferometry

Exposure apparatus and methods utilizing plural mask and object sta...

Multilayer-film reflective mirrors, extreme UV microlithography app...

Projection exposure apparatus and method

Projection exposure apparatus and method

Catadioptric reduction projection optical system and method

Catadioptric reduction projection optical system and method

Cata-dioptric reduction projection optical system

Apparatus and methods for measuring wavefront aberrations of a micr...

Catadioptric reduction projection optical system

Projection optical apparatus for projecting a mask pattern onto the...

Exposure apparatus for reproducing a mask pattern onto a photo-sens...

Catadioptric reduction projection optical system

Method and apparatus for manufacturing a diffraction grating zone p...

Interferometric surface profiler with an alignment optical member

Exposure apparatus for reproducing a mask pattern onto a photo-sens...

Exposure method and apparatus using holographic techniques

Video clock signal generator in an optical scanner in which a mask...

Illuminating optical apparatus

Catadioptric reduction projection optical system

Illumination optical arrangement

Catadioptric reduction projection optical system

Cata-dioptric reduction projection optical system

Laser beam harmonics generator and light exposing device

Position detection apparatus

Patents Applicationslast 30 patents

DISPLAY APPARATUS AND DISPLAY METHOD

IMAGE DISPLAY APPARATUS AND IMAGE DISPLAY METHOD

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, RECORDING METH...

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, RECORDING METH...

Exposure Method and Apparatus, and Electronic Device Manufacturing...

Projection optical system inspecting method and inspection apparatu...

Projection optical system inspecting method and inspection apparatu...

Method and apparatus for point diffraction interferometry

Projection eposure apparatus and method

Exposure apparatus and methods utilizing plural mask and object sta...

Interferometer system and method of manufacturing projection optica...

Catadioptric reduction projection optical system