Yutaka IGAKU

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Kawasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor apparatus and diagnostic test method
- Patent number 10,761,139
- Issue date Sep 1, 2020
- Renesas Electronics Corporation
- Shinichi Shibahara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control system, relay device and control method
- Patent number 10,576,968
- Issue date Mar 3, 2020
- Renesas Electronics Corporation
- Yasuhiro Yamakoshi
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Semiconductor device, diagnostic test, and diagnostic test circuit
- Patent number 10,520,549
- Issue date Dec 31, 2019
- Renesas Electronics Corporation
- Yukitoshi Tsuboi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor apparatus and diagnostic test method
- Patent number 10,151,796
- Issue date Dec 11, 2018
- Renesas Electronics Corporation
- Shinichi Shibahara
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, diagnostic test, and diagnostic test circuit
- Patent number 9,810,738
- Issue date Nov 7, 2017
- Renesas Electronics Corporation
- Yukitoshi Tsuboi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control system, relay device and control method
- Patent number 9,725,088
- Issue date Aug 8, 2017
- RENESAS ELECTRONICS CORPORATION
- Yasuhiro Yamakoshi
- B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR APPARATUS AND DIAGNOSTIC TEST METHOD
- Publication number 20190072611
- Publication date Mar 7, 2019
- Renesas Electronics Corporation
- Shinichi SHIBAHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE, DIAGNOSTIC TEST, AND DIAGNOSTIC TEST CIRCUIT
- Publication number 20180080984
- Publication date Mar 22, 2018
- RENESAS ELECTRONICS CORPORATION
- Yukitoshi TSUBOI
- G01 - MEASURING TESTING
Information Patent Application
CONTROL SYSTEM, RELAY DEVICE AND CONTROL METHOD
- Publication number 20170297570
- Publication date Oct 19, 2017
- RENESAS ELECTRONICS CORPORATION
- Yasuhiro YAMAKOSHI
- B60 - VEHICLES IN GENERAL
Information Patent Application
SEMICONDUCTOR APPARATUS AND DIAGNOSTIC TEST METHOD
- Publication number 20160349322
- Publication date Dec 1, 2016
- RENESAS ELECTRONICS CORPORATION
- Shinichi SHIBAHARA
- G01 - MEASURING TESTING
Information Patent Application
CONTROL SYSTEM, RELAY DEVICE AND CONTROL METHOD
- Publication number 20160059853
- Publication date Mar 3, 2016
- RENESAS ELECTRONICS CORPORATION
- Yasuhiro YAMAKOSHI
- B60 - VEHICLES IN GENERAL
Information Patent Application
SEMICONDUCTOR DEVICE, DIAGNOSTIC TEST, AND DIAGNOSTIC TEST CIRCUIT
- Publication number 20150293173
- Publication date Oct 15, 2015
- RENESAS ELECTRONICS CORPORATION
- Yukitoshi TSUBOI
- G01 - MEASURING TESTING