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Yutaka Ikku
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Chiba, JP
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Patents Grants
last 30 patents
Information
Patent Grant
ICP emission spectrophotometer
Patent number
10,309,903
Issue date
Jun 4, 2019
Hitachi High-Tech Science Corporation
Yutaka Ikku
G01 - MEASURING TESTING
Information
Patent Grant
Heat transfer system for an inductively coupled plasma device
Patent number
9,820,370
Issue date
Nov 14, 2017
Hitachi High-Tech Science Corporation
Yoshitomo Nakagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Energy dispersive X-ray analyzer and method for energy dispersive X...
Patent number
9,349,572
Issue date
May 24, 2016
Hitachi High-Tech Science Corporation
Yutaka Ikku
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-ray fluorescence analyzer and X-ray fluorescence analysis method
Patent number
8,611,493
Issue date
Dec 17, 2013
SII NanoTechnology Inc.
Kiyoshi Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
Composite charged particle beam apparatus, method of processing a s...
Patent number
7,973,280
Issue date
Jul 5, 2011
SII NanoTechnology Inc.
Haruo Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
X-ray tube and X-ray analysis apparatus
Patent number
7,634,054
Issue date
Dec 15, 2009
SII NanoTechnology Inc.
Yoshiki Matoba
G01 - MEASURING TESTING
Information
Patent Grant
X-ray tube and X-ray analysis apparatus
Patent number
7,627,088
Issue date
Dec 1, 2009
SII NanoTechnology Inc.
Yoshiki Matoba
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for specifying working position on a sample an...
Patent number
7,595,488
Issue date
Sep 29, 2009
SII Nano Technology Inc.
Junichi Tashiro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focused ion beam apparatus and sample section forming and thin-piec...
Patent number
7,531,796
Issue date
May 12, 2009
SII NanoTechnology Inc.
Junichi Tashiro
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus of measuring thin film sample and method and a...
Patent number
7,518,109
Issue date
Apr 14, 2009
SII NanoTechnology Inc.
Yutaka Ikku
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle beam apparatus
Patent number
7,442,942
Issue date
Oct 28, 2008
SII NanoTechnology Inc.
Haruo Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Fluorescent X-ray analysis apparatus
Patent number
7,436,926
Issue date
Oct 14, 2008
Sii Nano Technology Inc.
Yoshiki Matoba
G01 - MEASURING TESTING
Information
Patent Grant
Sample height regulating method, sample observing method, sample pr...
Patent number
7,423,266
Issue date
Sep 9, 2008
SII NanoTechnology Inc.
Junichi Tashiro
G01 - MEASURING TESTING
Information
Patent Grant
Pattern measuring method and measuring system using display microsc...
Patent number
7,054,506
Issue date
May 30, 2006
SII NanoTechnology Inc.
Yutaka Ikku
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Thin specimen producing method and apparatus
Patent number
7,002,150
Issue date
Feb 21, 2006
SII NanoTechnology Inc.
Kouji Iwasaki
G01 - MEASURING TESTING
Information
Patent Grant
Scanning microscope with brightness control
Patent number
6,924,481
Issue date
Aug 2, 2005
SII NanoTechnology Inc.
Yutaka Ikku
G01 - MEASURING TESTING
Information
Patent Grant
Focused ion beam apparatus
Patent number
6,888,149
Issue date
May 3, 2005
Seiko Instruments Inc.
Yutaka Ikku
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focused charged beam apparatus, and its processing and observation...
Patent number
5,525,806
Issue date
Jun 11, 1996
Seiko Instruments Inc.
Koji Iwasaki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ICP EMISSION SPECTROPHOTOMETER
Publication number
20180275069
Publication date
Sep 27, 2018
HITACHI HIGH-TECH SCIENCE CORPORATION
Yutaka IKKU
G01 - MEASURING TESTING
Information
Patent Application
SEQUENTIAL ICP OPTICAL EMISSION SPECTROMETER AND METHOD FOR CORRECT...
Publication number
20160290862
Publication date
Oct 6, 2016
HITACHI HIGH-TECH SCIENCE CORPORATION
Yutaka IKKU
G01 - MEASURING TESTING
Information
Patent Application
Inductively Coupled Plasma Generating Device and Inductively Couple...
Publication number
20160270201
Publication date
Sep 15, 2016
HITACHI HIGH-TECH SCIENCE CORPORATION
Yoshitomo Nakagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Energy Dispersive X-Ray Analyzer and Method for Energy Dispersive X...
Publication number
20150270094
Publication date
Sep 24, 2015
HITACHI HIGH-TECH SCIENCE CORPORATION
Yutaka Ikku
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ICP Optical Emission Spectrometer
Publication number
20150268169
Publication date
Sep 24, 2015
HITACHI HIGH-TECH SCIENCE CORPORATION
Yutaka Ikku
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE ANALYZER AND X-RAY FLUORESCENCE ANALYSIS METHOD
Publication number
20120051507
Publication date
Mar 1, 2012
Kiyoshi Hasegawa
G01 - MEASURING TESTING
Information
Patent Application
Section image acquiring method using combined charge particle beam...
Publication number
20090283677
Publication date
Nov 19, 2009
Yutaka IKKU
G01 - MEASURING TESTING
Information
Patent Application
Composite charged particle beam apparatus, method of processing a s...
Publication number
20090206254
Publication date
Aug 20, 2009
Haruo Takahashi
G01 - MEASURING TESTING
Information
Patent Application
Defect recognizing method, defect observing method, and charged par...
Publication number
20090134327
Publication date
May 28, 2009
Yutaka Ikku
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
X-RAY TUBE AND X-RAY ANALYSIS APPARATUS
Publication number
20090041196
Publication date
Feb 12, 2009
Yoshiki Matoba
G01 - MEASURING TESTING
Information
Patent Application
X-RAY TUBE AND X-RAY ANALYSIS APPARATUS
Publication number
20090028297
Publication date
Jan 29, 2009
Yoshiki Matoba
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus of measuring thin film sample and method and a...
Publication number
20080067384
Publication date
Mar 20, 2008
SII NANO TECHNOLOGY INC.
Yutaka Ikku
G01 - MEASURING TESTING
Information
Patent Application
FOCUSED ION BEAM APPARATUS AND SAMPLE SECTION FORMING AND THIN-PIEC...
Publication number
20080042059
Publication date
Feb 21, 2008
Junichi Tashiro
G01 - MEASURING TESTING
Information
Patent Application
Fluorescent X-ray analysis apparatus
Publication number
20070269004
Publication date
Nov 22, 2007
SII NANO TECHNOLOGY INC.
Yoshiki Matoba
G01 - MEASURING TESTING
Information
Patent Application
Charged particle beam apparatus
Publication number
20070045560
Publication date
Mar 1, 2007
Haruo Takahashi
G01 - MEASURING TESTING
Information
Patent Application
Sample height regulating method, sample observing method, sample pr...
Publication number
20060192118
Publication date
Aug 31, 2006
Junichi Tashiro
G01 - MEASURING TESTING
Information
Patent Application
Method for specifying observing or working position and apparatus t...
Publication number
20060138341
Publication date
Jun 29, 2006
Junichi Tashiro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Thin specimen producing method and apparatus
Publication number
20040245464
Publication date
Dec 9, 2004
Kouji Iwasaki
G01 - MEASURING TESTING
Information
Patent Application
Focused ion beam apparatus
Publication number
20040011964
Publication date
Jan 22, 2004
Seiko Instruments Inc.
Yutaka Ikku
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning electron microscope with appropriate brightness control fu...
Publication number
20020185597
Publication date
Dec 12, 2002
Yutaka Ikku
G01 - MEASURING TESTING
Information
Patent Application
Pattern measuring method and measuring system using display microsc...
Publication number
20020181776
Publication date
Dec 5, 2002
Yutaka Ikku
G06 - COMPUTING CALCULATING COUNTING