Yutaka Kitagawara

Person

Annaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for evaluating oxygen concentrating in semiconductor silicon...
- Patent number 5,841,532
- Issue date Nov 24, 1998
- Shin-Etsu Handotai Co., Ltd.
- Tomosuke Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating lifetime related quality of semiconductor surface
- Patent number 5,612,539
- Issue date Mar 18, 1997
- Shin-Etsu Handotai Co., Ltd.
- Ryoji Hoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating silicon wafers
- Patent number 5,533,387
- Issue date Jul 9, 1996
- Shin-Etsu Handotai Co., Ltd.
- Ken Aihara
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Determining carbon concentration in silicon single crystal by FT-IR
- Patent number 5,444,246
- Issue date Aug 22, 1995
- Shin-Etsu Handotai Co., Ltd.
- Yutaka Kitagawara
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determination of interstitial oxygen conce...
- Patent number 5,386,118
- Issue date Jan 31, 1995
- Shin-Etsu Handotai Co., Ltd.
- Yutaka Kitagawara
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for evaluation of spatial distribution of deep level concent...
- Patent number 5,302,832
- Issue date Apr 12, 1994
- Shin-Etsu Handotai Co., Ltd.
- Yutaka Kitagawara
- G01 - MEASURING TESTING
Information Patent Grant
Method for heat-treating gallium arsenide monocrystals
- Patent number 5,228,927
- Issue date Jul 20, 1993
- Shin-Etsu Handotai Company Limited
- Yutaka Kitagawara
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for heat-treating gallium arsenide monocrystals
- Patent number 5,209,811
- Issue date May 11, 1993
- Shin-Etsu Handotai Company Limited of Japan
- Yutaka Kitagawara
- C30 - CRYSTAL GROWTH

Yutaka Kitagawara

Person

Patents Grantslast 30 patents

Method for evaluating oxygen concentrating in semiconductor silicon...

Method of evaluating lifetime related quality of semiconductor surface

Method of evaluating silicon wafers

Determining carbon concentration in silicon single crystal by FT-IR

Method and apparatus for determination of interstitial oxygen conce...

Method for evaluation of spatial distribution of deep level concent...

Method for heat-treating gallium arsenide monocrystals

Method for heat-treating gallium arsenide monocrystals