Yutaka Komai

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Tsuchiuraq, JP

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Patents Grantslast 30 patents

Information Patent Grant
Synchronous semiconductor integrated circuit device capable of test...
- Patent number 6,385,125
- Issue date May 7, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Tsukasa Ooishi
- G11 - INFORMATION STORAGE
Information Patent Grant
Internal clock multiplication for test time reduction
- Patent number 6,069,829
- Issue date May 30, 2000
- Texas Instruments Incorporated
- Yutaka Komai
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing and repair of wide I/O semiconductor memory devices designe...
- Patent number 5,706,234
- Issue date Jan 6, 1998
- Texas Instruments Incorporated
- Charles J. Pilch
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SYNCHRONOUS SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE CAPABLE OF TEST...
- Publication number 20020051404
- Publication date May 2, 2002
- TSUKASA OOISHI
- G11 - INFORMATION STORAGE