Yutaka Shida

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Surface inspection method and apparatus
- Patent number 7,394,532
- Issue date Jul 1, 2008
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspecting apparatus and method
- Patent number 6,611,328
- Issue date Aug 26, 2003
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspecting apparatus and method
- Patent number 6,587,192
- Issue date Jul 1, 2003
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for surface inspection
- Patent number 6,204,918
- Issue date Mar 20, 2001
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Surface inspection method and apparatus
- Publication number 20040130727
- Publication date Jul 8, 2004
- Kabushiki Kaisha TOPCON
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Surface inspecting apparatus and method
- Publication number 20020021438
- Publication date Feb 21, 2002
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Surface inspecting apparatus and method
- Publication number 20020005945
- Publication date Jan 17, 2002
- Hisashi Isozaki
- G01 - MEASURING TESTING