Yutaka Tandai

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 10,304,654
- Issue date May 28, 2019
- Hitachi High-Technologies Corporation
- Akira Ikegami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect image classification apparatus
- Patent number 10,074,511
- Issue date Sep 11, 2018
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor defect categorization device and program for semicond...
- Patent number 9,881,365
- Issue date Jan 30, 2018
- Hitachi High-Technologies Corporation
- Yutaka Tandai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect image processing apparatus, defect image processing method,...
- Patent number 8,995,748
- Issue date Mar 31, 2015
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor defect classifying method, semiconductor defect class...
- Patent number 8,595,666
- Issue date Nov 26, 2013
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation object pattern determining apparatus, evaluation object...
- Patent number 8,139,845
- Issue date Mar 20, 2012
- Hitachi High-Technologies Corporation
- Takashi Noguchi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device
- Publication number 20180233320
- Publication date Aug 16, 2018
- Hitachi High-Technologies Corporation
- Akira IKEGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Defect Image Classification Apparatus
- Publication number 20160358746
- Publication date Dec 8, 2016
- Hitachi High-Technologies Corporation
- Takehiro HIRAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RECIPE GENERATION APPARATUS, INSPECTION SUPPORT APPARATUS, INSPECTI...
- Publication number 20140177940
- Publication date Jun 26, 2014
- Hitachi High-Technologies Corporation
- Ryo Nakagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT IMAGE PROCESSING APPARATUS, DEFECT IMAGE PROCESSING METHOD,...
- Publication number 20120141011
- Publication date Jun 7, 2012
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEFECT CLASSIFYING METHOD, SEMICONDUCTOR DEFECT CLASS...
- Publication number 20120131529
- Publication date May 24, 2012
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEFECT INTEGRATED PROJECTION METHOD AND DEFECT INSPEC...
- Publication number 20110296362
- Publication date Dec 1, 2011
- Tamao Ishikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATION OBJECT PATTERN DETERMINING APPARATUS, EVALUATION OBJECT...
- Publication number 20090110262
- Publication date Apr 30, 2009
- Takashi Noguchi
- G06 - COMPUTING CALCULATING COUNTING

Yutaka Tandai

Person

Patents Grantslast 30 patents

Charged particle beam device

Defect image classification apparatus

Semiconductor defect categorization device and program for semicond...

Defect image processing apparatus, defect image processing method,...

Semiconductor defect classifying method, semiconductor defect class...

Evaluation object pattern determining apparatus, evaluation object...

Patents Applicationslast 30 patents

Charged Particle Beam Device

Defect Image Classification Apparatus

RECIPE GENERATION APPARATUS, INSPECTION SUPPORT APPARATUS, INSPECTI...

DEFECT IMAGE PROCESSING APPARATUS, DEFECT IMAGE PROCESSING METHOD,...

SEMICONDUCTOR DEFECT CLASSIFYING METHOD, SEMICONDUCTOR DEFECT CLASS...

SEMICONDUCTOR DEFECT INTEGRATED PROJECTION METHOD AND DEFECT INSPEC...

EVALUATION OBJECT PATTERN DETERMINING APPARATUS, EVALUATION OBJECT...