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Ibaraki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Error determination apparatus, error determination method, and stor...
Patent number
11,698,252
Issue date
Jul 11, 2023
Mitutoyo Corporation
Yuto Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Measurement point determination method, non-transitory storage medi...
Patent number
11,530,908
Issue date
Dec 20, 2022
Mitutoyo Corporation
Takeshi Hagino
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Position specifying apparatus and position specifying method
Patent number
10,614,275
Issue date
Apr 7, 2020
Mitutoyo Corporation
Yuto Inoue
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
CALIBRATION DATA ACQUISITION METHOD AND INSPECTION GAUGE
Publication number
20250116497
Publication date
Apr 10, 2025
MITUTOYO CORPORATION
Yuto Inoue
G01 - MEASURING TESTING
Information
Patent Application
ERROR DETERMINATION APPARATUS, ERROR DETERMINATION METHOD, AND STOR...
Publication number
20220107177
Publication date
Apr 7, 2022
MITUTOYO CORPORATION
Yuto Inoue
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT POINT DETERMINATION METHOD, NON-TRANSITORY STORAGE MEDI...
Publication number
20200072591
Publication date
Mar 5, 2020
MITUTOYO CORPORATION
Takeshi HAGINO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
POSITION SPECIFYING APPARATUS AND POSITION SPECIFYING METHOD
Publication number
20170364723
Publication date
Dec 21, 2017
Mitutoyo Corporation
Yuto Inoue
G06 - COMPUTING CALCULATING COUNTING