Yuto KAZAMA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 11,971,425
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer and standard solution for evaluating scattered l...
- Patent number 11,692,929
- Issue date Jul 4, 2023
- HITACHI HIGH-TECH CORPORATION
- Sakuichiro Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 11,674,970
- Issue date Jun 13, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer and automated analysis method
- Patent number 11,187,712
- Issue date Nov 30, 2021
- Hitachi High-Technologies Corporation
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 10,976,333
- Issue date Apr 13, 2021
- HITACHI HIGH-TECH CORPORATION
- Yuto Kazama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20240272187
- Publication date Aug 15, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuto KAZAMA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20230266352
- Publication date Aug 24, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuto KAZAMA
- G01 - MEASURING TESTING
Information Patent Application
Automated Analyzer and Automated Analysis Method
- Publication number 20210405079
- Publication date Dec 30, 2021
- Hitachi High-Technologies Corporation
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20210190806
- Publication date Jun 24, 2021
- HITACHI HIGH-TECH CORPORATION
- Yuto KAZAMA
- G01 - MEASURING TESTING
Information Patent Application
Automated Analyzer and Automated Analysis Method
- Publication number 20200271677
- Publication date Aug 27, 2020
- Hitachi High-Technologies Corporation
- Yuto KAZAMA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20190162744
- Publication date May 30, 2019
- Hitachi High-Technologies Corporation
- Yuto KAZAMA
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analyzer and Standard Solution for Evaluating Scattered L...
- Publication number 20190025192
- Publication date Jan 24, 2019
- Hitachi High-Technologies Corporation
- Sakuichiro ADACHI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Yuto KAZAMA

Person

Patents Grantslast 30 patents

Automatic analysis device and automatic analysis method

Automatic analyzer and standard solution for evaluating scattered l...

Automatic analysis device and automatic analysis method

Automated analyzer and automated analysis method

Automatic analysis device and automatic analysis method

Patents Applicationslast 30 patents

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

Automated Analyzer and Automated Analysis Method

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

Automated Analyzer and Automated Analysis Method

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

Automatic Analyzer and Standard Solution for Evaluating Scattered L...