Yuudai Ishikawa

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Kumamoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 7,355,691
- Issue date Apr 8, 2008
- Hoya Corporation
- Noboru Yamaguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Defect inspection apparatus and defect inspection method
- Publication number 20070076195
- Publication date Apr 5, 2007
- Hoya Corporation
- Noboru Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Method of inspecting an mura defect in a pattern and apparatus used...
- Publication number 20050220330
- Publication date Oct 6, 2005
- Hoya Corporation
- Masaaki Kobayashi
- G01 - MEASURING TESTING