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Yuuhei Mouri
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Ichinomiya-shi, JP
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last 30 patents
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Patent Grant
Semiconductor device used for adjustment of output of a hall element
Patent number
8,629,521
Issue date
Jan 14, 2014
ON Semiconductor Trading, Ltd.
Takashi Ogawa
G01 - MEASURING TESTING
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last 30 patents
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SEMICONDUCTOR DEVICE
Publication number
20120049303
Publication date
Mar 1, 2012
ON SEMICONDUCTOR TRADING, LTD.
Takashi Ogawa
G01 - MEASURING TESTING