Yuuichi Hamamura

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Processing method and apparatus using focused ion beam generating m...
- Patent number 5,825,035
- Issue date Oct 20, 1998
- Hitachi, Ltd.
- Michinobu Mizumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process method and apparatus using focused ion beam generating means
- Patent number 5,583,344
- Issue date Dec 10, 1996
- Hitachi, Ltd.
- Michinobu Mizumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process method and apparatus using focused ion beam generating means
- Patent number 5,504,340
- Issue date Apr 2, 1996
- Hitachi, Ltd.
- Michinobu Mizumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing a sample using a charged beam and reactive gas...
- Patent number 5,447,614
- Issue date Sep 5, 1995
- Hitachi, Ltd.
- Yuuichi Hamamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for processing a sample using a charged beam and reactive...
- Patent number 5,342,448
- Issue date Aug 30, 1994
- Hitachi, Ltd.
- Yuuichi Hamamura
- H01 - BASIC ELECTRIC ELEMENTS