Yuuji Takagi

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Kamakura, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for monitoring semiconductor device manufactur...
- Patent number 8,547,429
- Issue date Oct 1, 2013
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Observing method and its apparatus using electron microscope
- Patent number 7,598,491
- Issue date Oct 6, 2009
- Hitachi High-Technologies Corporation
- Munenori Fukunishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of observing exposure condition for exposing semiconductor d...
- Patent number 6,913,861
- Issue date Jul 5, 2005
- Hitachi High-Technologies Corporation
- Chie Shishido
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspecting defects in a semiconductor wafer
- Patent number 6,792,366
- Issue date Sep 14, 2004
- Hitachi, Ltd.
- Naoki Hosoya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting defects in a semiconductor wafer
- Patent number 6,792,367
- Issue date Sep 14, 2004
- Hitachi, Ltd.
- Naoki Hosoya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of producing numerical control data for inspecting assembled...
- Patent number 5,134,575
- Issue date Jul 28, 1992
- Hitachi, Ltd.
- Yuuji Takagi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for monitoring semiconductor device manufacturing...
- Publication number 20090231424
- Publication date Sep 17, 2009
- Toshifumi Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Observing method and its apparatus using electron microscope
- Publication number 20060289752
- Publication date Dec 28, 2006
- Munenori Fukunishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for inspecting defects in a semiconductor wafer
- Publication number 20030109952
- Publication date Jun 12, 2003
- Hitachi, Ltd
- Naoki Hosoya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for inspecting defects in a semiconductor wafer
- Publication number 20030109070
- Publication date Jun 12, 2003
- Hitachi, Ltd
- Naoki Hosoya
- G06 - COMPUTING CALCULATING COUNTING