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Yuuji Wakamiya
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Kobe-shi, JP
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last 30 patents
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Patent number
8,663,557
Issue date
Mar 4, 2014
Sysmex Corporation
Eiji Tanoshima
G01 - MEASURING TESTING
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20050175504
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Aug 11, 2005
Eiji Tanoshima
G01 - MEASURING TESTING
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Sample analyzer, nucleic acid detector and nucleic acid detection m...
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20050042138
Publication date
Feb 24, 2005
Sysmex Corporation
Makoto Ueda
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL