Yuuki Kagehisa

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Ibaraki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Impact test apparatus and impact test method
- Patent number 7,222,515
- Issue date May 29, 2007
- Nitto Denki Corporation
- Takezou Hatanaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Impact test apparatus and impact test method
- Publication number 20060005606
- Publication date Jan 12, 2006
- Nitto Denko Corporation
- Takezou Hatanaka
- G01 - MEASURING TESTING