Yuuki Ooi

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Annaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting crystal defects
- Patent number 9,606,030
- Issue date Mar 28, 2017
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng Qu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing silicon single crystal wafer and annealed...
- Patent number 8,916,953
- Issue date Dec 23, 2014
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng Qu
- C30 - CRYSTAL GROWTH
Information Patent Grant
Bonded substrate and manufacturing method thereof
- Patent number 8,900,971
- Issue date Dec 2, 2014
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing bonded substrate having an insulator layer...
- Patent number 8,877,609
- Issue date Nov 4, 2014
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING SOI WAFER
- Publication number 20150287630
- Publication date Oct 8, 2015
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng Qu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING CRYSTAL DEFECTS
- Publication number 20140119399
- Publication date May 1, 2014
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng Qu
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING BONDED SUBSTRATE HAVING AN INSULATOR LAYER...
- Publication number 20140120695
- Publication date May 1, 2014
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BONDED SUBSTRATE AND MANUFACTURING METHOD THEREOF
- Publication number 20130341763
- Publication date Dec 26, 2013
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SILICON SINGLE CRYSTAL WAFER AND ANNEALED...
- Publication number 20130264685
- Publication date Oct 10, 2013
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng Qu
- C30 - CRYSTAL GROWTH