Yuushin Kimura

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor testing circuit, semiconductor testing jig, semicondu...
- Patent number 8,736,295
- Issue date May 27, 2014
- Fujitsu Limited
- Yuichi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor apparatus testing arrangement and semiconductor appar...
- Patent number 7,355,421
- Issue date Apr 8, 2008
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TESTING CIRCUIT, SEMICONDUCTOR TESTING JIG, SEMICONDU...
- Publication number 20110057681
- Publication date Mar 10, 2011
- Fujitsu Limited
- Yuichi Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor apparatus testing arrangement and semiconductor appar...
- Publication number 20070096761
- Publication date May 3, 2007
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING