Yuuya Sone

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Chiba, JP

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Patents Grantslast 30 patents

Information Patent Grant
User friendly analysis system
- Patent number 6,799,135
- Issue date Sep 28, 2004
- SII NanoTechnology Inc.
- Yuuya Sone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermal analysis apparatus
- Patent number 6,529,848
- Issue date Mar 4, 2003
- Seiko Instruments Inc.
- Yuuya Sone
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent x-ray method for determining x-ray alignment by lumines...
- Patent number 6,404,846
- Issue date Jun 11, 2002
- Seiko Instruments Inc.
- Kiyoshi Hasegawa
- G01 - MEASURING TESTING