Yuval Ben-Dov

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Los Altos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Direct relative motion measurement for vibration induced noise and...
- Patent number 7,249,002
- Issue date Jul 24, 2007
- KLA-Tencor Technologies Corporation
- Yuval Ben-Dov
- G01 - MEASURING TESTING
Information Patent Grant
Detection of process endpoint through monitoring fluctuation of out...
- Patent number 6,745,095
- Issue date Jun 1, 2004
- Applied Materials, Inc.
- Yuval Ben-Dov
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Spectral reflectance for in-situ film characteristic measurements
- Publication number 20030133126
- Publication date Jul 17, 2003
- Applied Materials, Inc.
- Moshe Sarfaty
- G01 - MEASURING TESTING