Yuval Dorfan

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Ra'anana, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting defects in wafers
- Patent number 7,813,541
- Issue date Oct 12, 2010
- Applied Materials South East Asia Pte. Ltd.
- Erez Sali
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for detecting defects in wafers
- Publication number 20060193507
- Publication date Aug 31, 2006
- Negevtech Ltd.
- Erez Sali
- G06 - COMPUTING CALCULATING COUNTING