Yuval Lamhot

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Haifa, IL

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Patents Grantslast 30 patents

Information Patent Grant
Reference image grouping in overlay metrology
- Patent number 11,861,824
- Issue date Jan 2, 2024
- KLA Corporation
- Einat Peled
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accuracy improvements in optical metrology
- Patent number 11,862,522
- Issue date Jan 2, 2024
- Barak Bringoltz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems and methods for scatterometric single-wavelength measuremen...
- Patent number 11,454,894
- Issue date Sep 27, 2022
- KLA Corporation
- Alon Yagil
- G01 - MEASURING TESTING
Information Patent Grant
Overlay measurement using multiple wavelengths
- Patent number 11,158,548
- Issue date Oct 26, 2021
- KLA-Tencor Corporation
- Yuval Lamhot
- G01 - MEASURING TESTING
Information Patent Grant
Quick adjustment of metrology measurement parameters according to p...
- Patent number 10,699,969
- Issue date Jun 30, 2020
- KLA-Tencor Corporation
- Einat Peled
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
PARALLAX METHOD FOR A SINGLE-CELL DIFFRACTION BASED MEASUREMENT OF...
- Publication number 20230259041
- Publication date Aug 17, 2023
- KLA Corporation
- Mordechy Kot
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEMS AND METHODS FOR SCATTEROMETRIC SINGLE-WAVELENGTH MEASUREMEN...
- Publication number 20220082950
- Publication date Mar 17, 2022
- KLA Corporation
- Alon Yagil
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACCURACY IMPROVEMENTS IN OPTICAL METROLOGY
- Publication number 20210175132
- Publication date Jun 10, 2021
- KLA-Tencor Corporation
- Barak Bringoltz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OVERLAY MEASUREMENT USING MULTIPLE WAVELENGTHS
- Publication number 20200381312
- Publication date Dec 3, 2020
- KLA-Tencor Corporation
- Yuval Lamhot
- G01 - MEASURING TESTING
Information Patent Application
Quick Adjustment Of Metrology Measurement Parameters According To P...
- Publication number 20190074227
- Publication date Mar 7, 2019
- Einat Peled
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACCURACY IMPROVEMENTS IN OPTICAL METROLOGY
- Publication number 20180047646
- Publication date Feb 15, 2018
- KLA-Tencor Corporation
- Barak Bringoltz
- G06 - COMPUTING CALCULATING COUNTING