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Yuya ISOMAE
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Computer system of observation device and processing method
Patent number
12,210,338
Issue date
Jan 28, 2025
HITACHI HIGH-TECH CORPORATION
Kosuke Matsumoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect observation device
Patent number
10,770,260
Issue date
Sep 8, 2020
Hitachi High-Technologies Corporation
Yuko Otani
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Inspection Device and Inspection Method
Publication number
20240280520
Publication date
Aug 22, 2024
Hitachi High-Tech Corporation
Takashi HIROI
G01 - MEASURING TESTING
Information
Patent Application
Computer System of Observation Device and Processing Method
Publication number
20220187810
Publication date
Jun 16, 2022
HITACHI HIGH-TECH CORPORATION
Kosuke MATSUMOTO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT OBSERVATION DEVICE
Publication number
20190237296
Publication date
Aug 1, 2019
Hitachi High-Technologies Corporation
Yuko OTANI
G06 - COMPUTING CALCULATING COUNTING