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Yuya Matsuoka

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Cuvette
    • Patent number D1037485
    • Issue date Jul 30, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Yuya Matsuoka
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Reaction vessel for automatic analyzer
    • Patent number 11,965,820
    • Issue date Apr 23, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Yuya Matsuoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wafer processing method and grinding apparatus
    • Patent number 11,929,256
    • Issue date Mar 12, 2024
    • Disco Corporation
    • Yuya Matsuoka
    • B24 - GRINDING POLISHING
  • Information Patent Grant

    Light source and biochemical analyzer
    • Patent number 11,906,420
    • Issue date Feb 20, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Yoshifumi Sekiguchi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Broadband light source device and biochemical analyzing device
    • Patent number 11,754,493
    • Issue date Sep 12, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Tomoto Kawamura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Method of processing workpiece
    • Patent number 11,471,991
    • Issue date Oct 18, 2022
    • Disco Corporation
    • Shunichiro Hirosawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Cuvette
    • Patent number D953567
    • Issue date May 31, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yuya Matsuoka
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Cuvette
    • Patent number D953569
    • Issue date May 31, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yuya Matsuoka
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Cuvette
    • Patent number D953566
    • Issue date May 31, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yuya Matsuoka
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Cuvette
    • Patent number D953568
    • Issue date May 31, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yuya Matsuoka
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Automated analyzer and control method for same
    • Patent number 11,054,433
    • Issue date Jul 6, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yuya Matsuoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis apparatus including a reaction container holding...
    • Patent number 10,753,870
    • Issue date Aug 25, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Yuya Matsuoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Protective tape attaching method
    • Patent number 10,622,230
    • Issue date Apr 14, 2020
    • Disco Corporation
    • Masaru Nakamura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Wafer processing method
    • Patent number 9,685,377
    • Issue date Jun 20, 2017
    • Disco Corporation
    • Masaru Nakamura
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    PICKUP METHOD AND PICKUP APPARATUS
    • Publication number 20240395575
    • Publication date Nov 28, 2024
    • Disco Corporation
    • Yuya MATSUOKA
    • B32 - LAYERED PRODUCTS
  • Information Patent Application

    AUTOMATIC ANALYZER AND REACTION VESSEL
    • Publication number 20240359183
    • Publication date Oct 31, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Norihiro HAYASHIDA
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    LIGHT SOURCE AND AUTOMATIC ANALYZER
    • Publication number 20240280485
    • Publication date Aug 22, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro Ando
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Light Source and Automatic Analyzer
    • Publication number 20240085311
    • Publication date Mar 14, 2024
    • Hitachi High-Tech Corporation
    • Shohei ARITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer and Insertion Method of Reaction Container
    • Publication number 20230184797
    • Publication date Jun 15, 2023
    • Hitachi High-Tech Corporation
    • Norihiro HAYASHIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20230107314
    • Publication date Apr 6, 2023
    • Hitachi High-Tech Corporation
    • Hitomi TSUJI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20220397581
    • Publication date Dec 15, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro ANDO
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    Light Source and Biochemical Analyzer
    • Publication number 20220214266
    • Publication date Jul 7, 2022
    • Hitachi High-Tech Corporation
    • Yoshifumi SEKIGUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAFER PROCESSING METHOD AND GRINDING APPARATUS
    • Publication number 20220115237
    • Publication date Apr 14, 2022
    • Disco Corporation
    • Yuya MATSUOKA
    • B24 - GRINDING POLISHING
  • Information Patent Application

    REACTION VESSEL FOR AUTOMATIC ANALYZER
    • Publication number 20220042902
    • Publication date Feb 10, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yuya Matsuoka
    • G01 - MEASURING TESTING
  • Information Patent Application

    BROADBAND LIGHT SOURCE DEVICE AND BIOCHEMICAL ANALYZING DEVICE
    • Publication number 20210381954
    • Publication date Dec 9, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Tomoto KAWAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD OF PROCESSING WORKPIECE
    • Publication number 20200230773
    • Publication date Jul 23, 2020
    • Disco Corporation
    • Shunichiro HIROSAWA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20200209265
    • Publication date Jul 2, 2020
    • Hitachi High-Technologies Corporation
    • Yuya MATSUOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Apparatus
    • Publication number 20190212262
    • Publication date Jul 11, 2019
    • Hitachi High-Technologies Corporation
    • Yuya MATSUOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROTECTIVE TAPE ATTACHING METHOD AND PROTECTIVE TAPE ATTACHING APPA...
    • Publication number 20180350641
    • Publication date Dec 6, 2018
    • Disco Corporation
    • Masaru Nakamura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Automated Analyzer and Control Method for Same
    • Publication number 20180275155
    • Publication date Sep 27, 2018
    • Hitachi High-Technologies Corporation
    • Yuya MATSUOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAFER PROCESSING METHOD
    • Publication number 20160172312
    • Publication date Jun 16, 2016
    • Disco Corporation
    • Masaru Nakamura
    • H01 - BASIC ELECTRIC ELEMENTS