Yuya NAGATA

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Kyoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Vibration measurement device
- Patent number 12,111,266
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection device
- Patent number 11,391,700
- Issue date Jul 19, 2022
- Samsung Electronics Co., Ltd.
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and method
- Patent number 10,942,152
- Issue date Mar 9, 2021
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method and defect detection device
- Patent number 10,429,172
- Issue date Oct 1, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Vibration measurement device
- Patent number 10,317,190
- Issue date Jun 11, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DETECTION DEVICE
- Publication number 20210270777
- Publication date Sep 2, 2021
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION MEASUREMENT DEVICE
- Publication number 20210096085
- Publication date Apr 1, 2021
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
SOUND-WAVE-PROPAGATION VISUALIZATION DEVICE AND METHOD
- Publication number 20190204275
- Publication date Jul 4, 2019
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE
- Publication number 20180356205
- Publication date Dec 13, 2018
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION MEASUREMENT DEVICE
- Publication number 20180283847
- Publication date Oct 4, 2018
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING