Yuya YAMADA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Threat analysis system, threat analysis device, threat analysis met...
- Patent number 12,169,558
- Issue date Dec 17, 2024
- NEC Corporation
- Takahiro Kakumaru
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Face image processing device and face image processing program
- Patent number 11,682,128
- Issue date Jun 20, 2023
- Aisin Seiki Kabushiki Kaisha
- Shin-ichi Kojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test carrier and electronic component testing apparatus
- Patent number 11,579,187
- Issue date Feb 14, 2023
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 11,181,576
- Issue date Nov 23, 2021
- Advantest Corporation
- Yasuyuki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Facial recognition device
- Patent number 11,074,431
- Issue date Jul 27, 2021
- Aisin Seiki Kabushiki Kaisha
- Yuya Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Occupant monitoring device, occupant monitoring method, and occupan...
- Patent number 11,048,952
- Issue date Jun 29, 2021
- Aisin Seiki Kabushiki Kaisha
- Shin Osuga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Eyeball information detection device, eyeball information detection...
- Patent number 10,733,438
- Issue date Aug 4, 2020
- Aisin Seiki Kabushiki Kaisha
- Shin Osuga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Eyeball information estimation device, eyeball information estimati...
- Patent number 10,706,585
- Issue date Jul 7, 2020
- Aisin Seiki Kabushiki Kaisha
- Yuya Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device holder, inner unit, outer unit, and tray
- Patent number 9,874,605
- Issue date Jan 23, 2018
- Advantest Corporation
- Mitsunori Aizawa
- G01 - MEASURING TESTING
Information Patent Grant
Handler apparatus that conveys a device under test to a test socket...
- Patent number 9,784,789
- Issue date Oct 10, 2017
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Handler apparatus, device holder, and test apparatus
- Patent number 9,772,373
- Issue date Sep 26, 2017
- Advantest Corporation
- Mitsunori Aizawa
- G01 - MEASURING TESTING
Information Patent Grant
Handler apparatus, adjustment method of handler apparatus, and test...
- Patent number 9,658,287
- Issue date May 23, 2017
- Advantest Corporation
- Tsuyoshi Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Handler apparatus that conveys a device under test to a test socket...
- Patent number 9,606,170
- Issue date Mar 28, 2017
- Advantest Corporation
- Tsuyoshi Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Fixture unit, fixture apparatus, handler apparatus, and test apparatus
- Patent number 9,506,948
- Issue date Nov 29, 2016
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Actuator, handler apparatus and test apparatus
- Patent number 9,453,874
- Issue date Sep 27, 2016
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 8,576,647
- Issue date Nov 5, 2013
- Elpida Memory, Inc.
- Yuya Yamada
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPA...
- Publication number 20250027988
- Publication date Jan 23, 2025
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE ADJUSTING SYSTEM, CONTROLLER, ELECTRONIC DEVICE HANDLIN...
- Publication number 20240402240
- Publication date Dec 5, 2024
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...
- Publication number 20230305053
- Publication date Sep 28, 2023
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE ADJUSTING DEVICE, ELECTRONIC COMPONENT HANDLING APPARAT...
- Publication number 20230296666
- Publication date Sep 21, 2023
- Advantest Corporation
- Yuya Yamada
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...
- Publication number 20230251304
- Publication date Aug 10, 2023
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
TEST CARRIER AND ELECTRONIC COMPONENT TESTING APPARATUS
- Publication number 20230023699
- Publication date Jan 26, 2023
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Application
FACE IMAGE PROCESSING DEVICE AND FACE IMAGE PROCESSING PROGRAM
- Publication number 20210312648
- Publication date Oct 7, 2021
- AISIN SEIKI KABUSHIKI KAISHA
- Shin-ichi KOJIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREAT ANALYSIS SYSTEM, THREAT ANALYSIS DEVICE, THREAT ANALYSIS MET...
- Publication number 20210248232
- Publication date Aug 12, 2021
- NEC Corporation
- Takahiro KAKUMARU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...
- Publication number 20200371158
- Publication date Nov 26, 2020
- Advantest Corporation
- Yasuyuki Kato
- G01 - MEASURING TESTING
Information Patent Application
LINE-OF-SIGHT MEASUREMENT DEVICE
- Publication number 20200305712
- Publication date Oct 1, 2020
- AISIN SEIKI KABUSHIKI KAISHA
- Shin-ichi KOJIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EYEBALL INFORMATION DETECTION DEVICE, EYEBALL INFORMATION DETECTION...
- Publication number 20200104590
- Publication date Apr 2, 2020
- AISIN SEIKI KABUSHIKI KAISHA
- Shin OSUGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OCCUPANT MONITORING DEVICE, OCCUPANT MONITORING METHOD, AND OCCUPAN...
- Publication number 20200104615
- Publication date Apr 2, 2020
- AISIN SEIKI KABUSHIKI KAISHA
- Shin OSUGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EYEBALL INFORMATION ESTIMATION DEVICE, EYEBALL INFORMATION ESTIMATI...
- Publication number 20200105016
- Publication date Apr 2, 2020
- AISIN SEIKI KABUSHIKI KAISHA
- Yuya YAMADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FACIAL RECOGNITION DEVICE
- Publication number 20200034603
- Publication date Jan 30, 2020
- AISIN SEIKI KABUSHIKI KAISHA
- Yuya YAMADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FIXTURE UNIT, FIXTURE APPARATUS, HANDLER APPARATUS, AND TEST APPARATUS
- Publication number 20150276801
- Publication date Oct 1, 2015
- Advantest Corporation
- Yuya YAMADA
- G01 - MEASURING TESTING
Information Patent Application
Handler Apparatus and Test Apparatus
- Publication number 20150276863
- Publication date Oct 1, 2015
- Advantest Corporation
- Tsuyoshi YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
Handler Apparatus and Test Apparatus
- Publication number 20150276862
- Publication date Oct 1, 2015
- Advantest Corporation
- Aritomo KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE HOLDER, INNER UNIT, OUTER UNIT, AND TRAY
- Publication number 20150276859
- Publication date Oct 1, 2015
- Advantest Corporation
- Mitsunori AIZAWA
- G01 - MEASURING TESTING
Information Patent Application
HANDLER APPARATUS, DEVICE HOLDER, AND TEST APPARATUS
- Publication number 20150276860
- Publication date Oct 1, 2015
- Advantest Corporation
- Mitsunori AIZAWA
- G01 - MEASURING TESTING
Information Patent Application
HANDLER APPARATUS, ADJUSTMENT METHOD OF HANDLER APPARATUS, AND TEST...
- Publication number 20150276861
- Publication date Oct 1, 2015
- Advantest Corporation
- Tsuyoshi YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
ACTUATOR, HANDLER APPARATUS AND TEST APPARATUS
- Publication number 20150276852
- Publication date Oct 1, 2015
- Advantest Corporation
- Aritomo KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20120113734
- Publication date May 10, 2012
- Elpida Memory, Inc.
- Yuya YAMADA
- G11 - INFORMATION STORAGE

Yuya YAMADA

Person

Patents Grantslast 30 patents

Threat analysis system, threat analysis device, threat analysis met...

Face image processing device and face image processing program

Test carrier and electronic component testing apparatus

Electronic component handling apparatus and electronic component te...

Facial recognition device

Occupant monitoring device, occupant monitoring method, and occupan...

Eyeball information detection device, eyeball information detection...

Eyeball information estimation device, eyeball information estimati...

Device holder, inner unit, outer unit, and tray

Handler apparatus that conveys a device under test to a test socket...

Handler apparatus, device holder, and test apparatus

Handler apparatus, adjustment method of handler apparatus, and test...

Handler apparatus that conveys a device under test to a test socket...

Fixture unit, fixture apparatus, handler apparatus, and test apparatus

Actuator, handler apparatus and test apparatus

Semiconductor device

Patents Applicationslast 30 patents

TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPA...

TEMPERATURE ADJUSTING SYSTEM, CONTROLLER, ELECTRONIC DEVICE HANDLIN...

ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...

TEMPERATURE ADJUSTING DEVICE, ELECTRONIC COMPONENT HANDLING APPARAT...

ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...

TEST CARRIER AND ELECTRONIC COMPONENT TESTING APPARATUS

FACE IMAGE PROCESSING DEVICE AND FACE IMAGE PROCESSING PROGRAM

THREAT ANALYSIS SYSTEM, THREAT ANALYSIS DEVICE, THREAT ANALYSIS MET...

ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...

LINE-OF-SIGHT MEASUREMENT DEVICE

EYEBALL INFORMATION DETECTION DEVICE, EYEBALL INFORMATION DETECTION...

OCCUPANT MONITORING DEVICE, OCCUPANT MONITORING METHOD, AND OCCUPAN...

EYEBALL INFORMATION ESTIMATION DEVICE, EYEBALL INFORMATION ESTIMATI...

FACIAL RECOGNITION DEVICE

FIXTURE UNIT, FIXTURE APPARATUS, HANDLER APPARATUS, AND TEST APPARATUS

Handler Apparatus and Test Apparatus

Handler Apparatus and Test Apparatus

DEVICE HOLDER, INNER UNIT, OUTER UNIT, AND TRAY

HANDLER APPARATUS, DEVICE HOLDER, AND TEST APPARATUS

HANDLER APPARATUS, ADJUSTMENT METHOD OF HANDLER APPARATUS, AND TEST...

ACTUATOR, HANDLER APPARATUS AND TEST APPARATUS

SEMICONDUCTOR DEVICE