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Shanghai, CN
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last 30 patents
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Patent Grant
Optical measurement device and method
Patent number
10,921,719
Issue date
Feb 16, 2021
SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
Zhiyong Yang
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement device and method with improved measurement pre...
Patent number
10,907,952
Issue date
Feb 2, 2021
SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
Yuzhi Li
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
OPTICAL MEASUREMENT DEVICE AND METHOD
Publication number
20190235396
Publication date
Aug 1, 2019
SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
Zhiyong YANG
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT DEVICE AND METHOD
Publication number
20190226831
Publication date
Jul 25, 2019
SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
Yuzhi LI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY