Yuzo Nagumo

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Surface processing progress monitoring system
- Patent number 9,460,973
- Issue date Oct 4, 2016
- Shimadzu Corporation
- Rui Kato
- G01 - MEASURING TESTING
Information Patent Grant
Thickness monitoring device, etching depth monitoring device and th...
- Patent number 9,228,828
- Issue date Jan 5, 2016
- Shimadzu Corporation
- Hiroomi Goto
- G01 - MEASURING TESTING
Information Patent Grant
Depth of hole measurement by subtracting area of two spectra separa...
- Patent number 9,007,599
- Issue date Apr 14, 2015
- Shimadzu Corporation
- Hiroomi Goto
- G01 - MEASURING TESTING
Information Patent Grant
Etching monitor device
- Patent number 9,001,337
- Issue date Apr 7, 2015
- Shimadzu Corporation
- Hiroomi Goto
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device
- Patent number 7,911,610
- Issue date Mar 22, 2011
- Shimadzu Corporation
- Naoji Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device and method, and nanoparticle measuring met...
- Patent number 7,760,356
- Issue date Jul 20, 2010
- Shimadzu Corporation
- Naoji Moriya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE PROCESSING PROGRESS MONITORING SYSTEM
- Publication number 20140307262
- Publication date Oct 16, 2014
- Shimadzu Corporation
- Rui KATO
- G01 - MEASURING TESTING
Information Patent Application
THICKNESS MONITORING DEVICE, ETCHING DEPTH MONITORING DEVICE AND TH...
- Publication number 20130334422
- Publication date Dec 19, 2013
- Hiroomi GOTO
- G01 - MEASURING TESTING
Information Patent Application
ETCHING MONITOR DEVICE
- Publication number 20130314692
- Publication date Nov 28, 2013
- Shimadzu Corporation
- Hiroomi GOTO
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TREATMENT STATUS MONITORING DEVICE
- Publication number 20130265587
- Publication date Oct 10, 2013
- Shimadzu Corporation
- Hiroomi GOTO
- G01 - MEASURING TESTING
Information Patent Application
Surface Processing Progress Monitoring System
- Publication number 20130169958
- Publication date Jul 4, 2013
- Shimadzu Corporation
- Hiroomi GOTO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE
- Publication number 20090251695
- Publication date Oct 8, 2009
- Naoji Moriya
- G01 - MEASURING TESTING
Information Patent Application
Optical Measuring Device and Method, and Nanoparticle Measuring Met...
- Publication number 20080192252
- Publication date Aug 14, 2008
- Shimadzu Corporation
- Naoji Moriya
- G01 - MEASURING TESTING