Yuzo Nakamura

Person

Ina-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for inspecting a substrate
- Patent number 6,707,546
- Issue date Mar 16, 2004
- Olympus Optical Co., Ltd.
- Hiroyuki Okahira
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting a substrate
- Patent number 6,671,041
- Issue date Dec 30, 2003
- Olympus Optical Co., Ltd.
- Hiroyuki Okahira
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting a substrate
- Patent number 6,362,884
- Issue date Mar 26, 2002
- Olympus Optical Co., Ltd.
- Hiroyuki Okahira
- G02 - OPTICS
Information Patent Grant
Atomic force microscope
- Patent number 5,260,824
- Issue date Nov 9, 1993
- Olympus Optical Co., Ltd.
- Takao Okada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ultrasonic microscope
- Patent number D303267
- Issue date Sep 5, 1989
- Olympus Optical Co., Ltd.
- Manabu Takahashi
- D16 - Photography and optical equipment
Information Patent Grant
Microscope having an optical head and an additional head
- Patent number 4,726,229
- Issue date Feb 23, 1988
- Olympus Optical Co., Ltd.
- Soji Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic microscope
- Patent number 4,621,531
- Issue date Nov 11, 1986
- Olympus Optical Co., Ltd.
- Yuzo Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism for attaching ultrasonic head of ultrasonic microscope
- Patent number 4,587,848
- Issue date May 13, 1986
- Olympus Optical Co., Ltd.
- Yuzo Nakamura
- G10 - MUSICAL INSTRUMENTS ACOUSTICS

Patents Applicationslast 30 patents

Information Patent Application
Apparatus for inspecting a substrate
- Publication number 20020057429
- Publication date May 16, 2002
- Olympus Optical Co., Ltd.
- Hiroyuki Okahira
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for inspecting a substrate
- Publication number 20010002862
- Publication date Jun 7, 2001
- Hiroyuki Okahira
- G01 - MEASURING TESTING

Yuzo Nakamura

Person

Patents Grantslast 30 patents

Apparatus for inspecting a substrate

Apparatus for inspecting a substrate

Apparatus for inspecting a substrate

Atomic force microscope

Ultrasonic microscope

Microscope having an optical head and an additional head

Ultrasonic microscope

Mechanism for attaching ultrasonic head of ultrasonic microscope

Patents Applicationslast 30 patents

Apparatus for inspecting a substrate

Apparatus for inspecting a substrate