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Yuzuru Mizuhara

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Charged particle beam device and power supply device
    • Patent number 11,810,752
    • Issue date Nov 7, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Wen Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam apparatus and control method
    • Patent number 11,610,756
    • Issue date Mar 21, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Kaori Bizen
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam device
    • Patent number 11,456,150
    • Issue date Sep 27, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Kaori Bizen
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged-particle beam device
    • Patent number 10,964,508
    • Issue date Mar 30, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yuzuru Mizuhara
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam device
    • Patent number 10,541,103
    • Issue date Jan 21, 2020
    • Hitachi High-Technologies Corporation
    • Yuzuru Mizuhara
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam device
    • Patent number 10,446,359
    • Issue date Oct 15, 2019
    • Hitachi High-Technologies Corporation
    • Toshiyuki Yokosuka
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam inclination correction method and charged par...
    • Patent number 10,229,811
    • Issue date Mar 12, 2019
    • Hitachi High-Technologies Corporation
    • Yuzuru Mizuhara
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam device
    • Patent number 10,020,160
    • Issue date Jul 10, 2018
    • Hitachi High-Technologies Corporation
    • Koichi Kuroda
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam device
    • Patent number 9,627,171
    • Issue date Apr 18, 2017
    • Hitachi High-Technologies Corporation
    • Hiroshi Makino
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam apparatus
    • Patent number 9,502,212
    • Issue date Nov 22, 2016
    • Hitachi High-Technologies Corporation
    • Yuzuru Mizuhara
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Scanning electron microscope
    • Patent number 9,472,376
    • Issue date Oct 18, 2016
    • Hitachi High-Technologies Corporation
    • Toshiyuki Yokosuka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Charged particle beam apparatus
    • Patent number 8,648,300
    • Issue date Feb 11, 2014
    • Hitachi High-Technologies Corporation
    • Miki Isawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE, AND METHOD FOR ADJUSTING IMAGE CAPTUR...
    • Publication number 20230230796
    • Publication date Jul 20, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Tomohito NAKANO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20230010272
    • Publication date Jan 12, 2023
    • Hitachi High-Tech Corporation
    • Shinichi MURAKAMI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD
    • Publication number 20220115203
    • Publication date Apr 14, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Kaori BIZEN
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE AND POWER SUPPLY DEVICE
    • Publication number 20220068595
    • Publication date Mar 3, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Wen Li
    • H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20210313140
    • Publication date Oct 7, 2021
    • Kaori BIZEN
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged-Particle Beam Device
    • Publication number 20200258713
    • Publication date Aug 13, 2020
    • Hitachi High-Technologies Corporation
    • Yuzuru MIZUHARA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20180012725
    • Publication date Jan 11, 2018
    • Hitachi High-Technologies Corporation
    • Toshiyuki YOKOSUKA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20170345613
    • Publication date Nov 30, 2017
    • Hitachi High-Technologies Corporation
    • Yuzuru MIZUHARA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20170221672
    • Publication date Aug 3, 2017
    • Hitachi High-Technologies Corporation
    • Koichi KURODA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Inclination Correction Method and Charged Par...
    • Publication number 20160217969
    • Publication date Jul 28, 2016
    • Hitachi High-Technologies Corporation
    • Yuzuru MIZUHARA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20150357153
    • Publication date Dec 10, 2015
    • Hitachi High-Technologies Corporation
    • Hiroshi MAKINO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Apparatus
    • Publication number 20150348748
    • Publication date Dec 3, 2015
    • Hitachi High-Technologies Corporation
    • Yuzuru MIZUHARA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20150008322
    • Publication date Jan 8, 2015
    • Hitachi High-Technologies Corporation
    • Toshiyuki Yokosuka
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHARGED PARTICLE BEAM APPARATUS
    • Publication number 20140014836
    • Publication date Jan 16, 2014
    • Hitachi High-Technologies Corporation
    • Miki ISAWA
    • G01 - MEASURING TESTING