Yuzuru Mochizuki

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam system
- Patent number 11,961,704
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Naoki Akimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and capturing condition adjusting meth...
- Patent number 10,770,266
- Issue date Sep 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Tomohito Nakano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for adjusting imaging co...
- Patent number 10,566,172
- Issue date Feb 18, 2020
- Hitachi High-Technologies Corporation
- Tomohito Nakano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and image capturing method using electron beam
- Patent number 8,907,279
- Issue date Dec 9, 2014
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam System
- Publication number 20220223372
- Publication date Jul 14, 2022
- Hitachi High-Tech Corporation
- Naoki AKIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Capturing Condition Adjusting Meth...
- Publication number 20200035449
- Publication date Jan 30, 2020
- Hitachi High-Technologies Corporation
- Tomohito NAKANO
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Apparatus and Method for Adjusting Imaging Co...
- Publication number 20190172676
- Publication date Jun 6, 2019
- Hitachi High-Technologies Corporation
- Tomohito NAKANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND IMAGE CAPTURING METHOD USING ELECTRON BEAM
- Publication number 20140097342
- Publication date Apr 10, 2014
- Natsuki Tsuno
- G01 - MEASURING TESTING