Yvan J. Beliveau

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Blacksburg, VA, US

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Patents Grantslast 30 patents

Information Patent Grant
Low cost 2D position measurement system and method
- Patent number 6,545,751
- Issue date Apr 8, 2003
- ARC Second, Inc.
- Sean Beliveau
- G01 - MEASURING TESTING
Information Patent Grant
Transmitter and receiver units for spatial position measurement system
- Patent number 5,579,102
- Issue date Nov 26, 1996
- Spatial Positioning Systems, Inc.
- Timothy Pratt
- G01 - MEASURING TESTING
Information Patent Grant
Transmitter and receiver units for spatial position measurement system
- Patent number 5,461,473
- Issue date Oct 24, 1995
- Spatial Positioning Systems, Inc.
- Timothy Pratt
- G01 - MEASURING TESTING
Information Patent Grant
Spatial positioning system
- Patent number 5,294,970
- Issue date Mar 15, 1994
- Spatial Positioning Systems, Inc.
- Andrew W. Dornbusch
- G01 - MEASURING TESTING
Information Patent Grant
Spatial measurement recovery system
- Patent number 5,247,487
- Issue date Sep 21, 1993
- Spatial Positioning Systems, Inc.
- Yvan J. Beliveau
- G01 - MEASURING TESTING
Information Patent Grant
Spatial positioning and measurement system
- Patent number 5,110,202
- Issue date May 5, 1992
- Spatial Positioning Systems, Inc.
- Andrew W. Dornbusch
- G01 - MEASURING TESTING
Information Patent Grant
Spatial positioning system
- Patent number 5,100,229
- Issue date Mar 31, 1992
- Spatial Positioning Systems, Inc.
- Eric Lundberg
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Low cost 2D position measurement system and method
- Publication number 20020008870
- Publication date Jan 24, 2002
- Sean Beliveau
- G01 - MEASURING TESTING