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Yves Leon VAN HAARLEM
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Erskinville, AU
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last 30 patents
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Patent Grant
Trace element X-ray flourescence analyser using dual focusing X-ray...
Patent number
9,291,583
Issue date
Mar 22, 2016
THE COMMONWEALTH OF AUSTRALIA COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH...
Yves Leon Van Haarlem
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
TRACE ELEMENT X-RAY FLOURESCENCE ANALYSER USING DUAL FOCUSING X-RAY...
Publication number
20140037053
Publication date
Feb 6, 2014
Commonwealth Scientific and Industrial Research Organisation
Yves Leon VAN HAARLEM
G01 - MEASURING TESTING