Yves SURREL

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SAINT ETIENNE, FR

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Patents Applicationslast 30 patents

Information Patent Application
DEFLECTOMETRY MEASUREMENT METHOD
- Publication number 20250035432
- Publication date Jan 30, 2025
- WYSE LIGHT
- SURREL Yves
- G01 - MEASURING TESTING
Information Patent Application
Installation for the quality control of a surface of an object
- Publication number 20110285987
- Publication date Nov 24, 2011
- VISUOL TECHNOLOGIES
- Yves SURREL
- G01 - MEASURING TESTING
Information Patent Application
Device for inspecting the quality of a surface
- Publication number 20090257052
- Publication date Oct 15, 2009
- VISUOL TECHNOLOGIES
- Yves SURREL
- G01 - MEASURING TESTING