Zachary Reid

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Los Gatos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Process condition measuring device
- Patent number 8,104,342
- Issue date Jan 31, 2012
- KLA-Tencor Corporation
- Mei H. Sun
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
PROCESS CONDITION MEASURING DEVICE
- Publication number 20130029433
- Publication date Jan 31, 2013
- KLA-Tencor Corporation
- Mei H. Sun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS CONDITION MEASURING DEVICE
- Publication number 20090056441
- Publication date Mar 5, 2009
- KLA-Tencor Corporation
- Mei H. Sun
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY