TREA

Zaifu Zhang

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  • Austin, TX, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Electronic device testing system
    • Patent number 7,941,718
    • Issue date May 10, 2011
    • FREESCALE SEMICONDUCTOR, INC.
    • Zaifu Zhang
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Electronic device testing system
    • Publication number 20070214398
    • Publication date Sep 13, 2007
    • FREESCALE SEMICONDUCTOR, INC.
    • Zaifu Zhang
    • G01 - MEASURING TESTING