Zdenek AXMAN

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Sebetov, CZ

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Patents Grantslast 30 patents

Information Patent Grant
Devices, systems and processes for improving frequency measurements...
- Patent number 12,070,772
- Issue date Aug 27, 2024
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Zdenek Axman
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Devices, systems and processes for improving frequency measurements...
- Patent number 11,759,822
- Issue date Sep 19, 2023
- Semiconductor Components Industries, LLC
- Zdenek Axman
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
Response-based determination of piezoelectric transducer state
- Patent number 11,269,067
- Issue date Mar 8, 2022
- Semiconductor Components Industries, LLC
- Jiri Kutej
- G01 - MEASURING TESTING
Information Patent Grant
Measuring resonance parameters of piezoelectric transducers
- Patent number 11,194,028
- Issue date Dec 7, 2021
- Semiconductor Components Industries, LLC
- Jiri Kutej
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
DEVICES, SYSTEMS AND PROCESSES FOR IMPROVING FREQUENCY MEASUREMENTS...
- Publication number 20230405634
- Publication date Dec 21, 2023
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Zdenek AXMAN
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Application
DEVICES, SYSTEMS AND PROCESSES FOR IMPROVING FREQUENCY MEASUREMENTS...
- Publication number 20210220871
- Publication date Jul 22, 2021
- Semiconductor Components Industries, LLC
- Zdenek AXMAN
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Application
RESPONSE-BASED DETERMINATION OF PIEZOELECTRIC TRANSDUCER STATE
- Publication number 20190079173
- Publication date Mar 14, 2019
- Semiconductor Components Industries, LLC
- Jiri KUTEJ
- G01 - MEASURING TESTING
Information Patent Application
MEASURING RESONANCE PARAMETERS OF PIEZOELECTRIC TRANSDUCERS
- Publication number 20190079174
- Publication date Mar 14, 2019
- Semiconductor Components Industries, LLC
- Jiri KUTEJ
- G01 - MEASURING TESTING