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Chengdu, CN
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last 30 patents
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Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
Patent number
11,774,380
Issue date
Oct 3, 2023
Sichuan University
Yuanjun Xu
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
RICE-CROP INTENSITY IDENTIFICATION METHOD BASED ON RADAR TIME SERIE...
Publication number
20250020772
Publication date
Jan 16, 2025
University of Electronic Science and Technology of China
Shihua Li
G01 - MEASURING TESTING