Zeev Smilansky

Person

D.N. Emek Soreg, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system to calibrate a camera clock using flicker
- Patent number 11,528,466
- Issue date Dec 13, 2022
- EMZA VISUAL SENSE LTD
- Zeev Smilansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system to allow object detection in visual images by tra...
- Patent number 10,990,859
- Issue date Apr 27, 2021
- EMZA VISUAL SENSE LTD
- Zeev Smilansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Motion detection in digital images and a communication method of th...
- Patent number 10,984,536
- Issue date Apr 20, 2021
- EMZA VISUAL SENSE LTD
- Zeev Smilansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pixel design with temporal analysis capabilities for scene interpre...
- Patent number 9,124,824
- Issue date Sep 1, 2015
- EZMA VISUAL SENSE LTD.
- Zeev Smilansky
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Universal counting and measurement system
- Patent number 8,457,384
- Issue date Jun 4, 2013
- Zeev Smilansky
- G01 - MEASURING TESTING
Information Patent Grant
Multiple optical input inspection system
- Patent number 7,925,073
- Issue date Apr 12, 2011
- Orbotech Ltd.
- Saki Itzhak Hakim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Miniature autonomous agents for scene interpretation
- Patent number 7,903,841
- Issue date Mar 8, 2011
- Emza Visual Sense
- Zeev Smilansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Miniature autonomous agents for scene interpretation
- Patent number 7,489,802
- Issue date Feb 10, 2009
- Zeev Smilansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pixel based machine for patterned wafers
- Patent number 7,454,052
- Issue date Nov 18, 2008
- Applied Materials, Inc.
- Zeev Smilansky
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for the inspection of objects
- Patent number 7,388,978
- Issue date Jun 17, 2008
- Orbotech Ltd.
- Sharon Duvdevani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple optical input inspection system
- Patent number 7,231,080
- Issue date Jun 12, 2007
- Orbotech Ltd.
- Saki Itzhak Hakim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods for the inspection of objects
- Patent number 7,206,443
- Issue date Apr 17, 2007
- Orbotech Ltd.
- Sharon Duvdevani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods for the inspection of objects
- Patent number 7,181,059
- Issue date Feb 20, 2007
- Orbotech Ltd.
- Sharon Duvdevani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pixel based machine for patterned wafers
- Patent number 7,016,526
- Issue date Mar 21, 2006
- Applied Materials, Inc.
- Zeev Smilansky
- G01 - MEASURING TESTING
Information Patent Grant
Pixel based machine for patterned wafers
- Patent number 6,810,139
- Issue date Oct 26, 2004
- Applied Materials, Inc.
- Zeev Smilansky
- G01 - MEASURING TESTING
Information Patent Grant
Automatic visual inspection system
- Patent number RE38559
- Issue date Jul 27, 2004
- Amiram Caspi
- 382 - Image analysis
Information Patent Grant
Pixel based machine for patterned wafers
- Patent number 6,366,690
- Issue date Apr 2, 2002
- Applied Materials, Inc.
- Zeev Smilansky
- G01 - MEASURING TESTING
Information Patent Grant
Method for processing variable speed scenes for computer games
- Patent number 6,323,856
- Issue date Nov 27, 2001
- Shmuel Banitt
- Zeev Smilansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic visual inspection system
- Patent number 5,774,573
- Issue date Jun 30, 1998
- Orbotech Ltd.
- Amiran Caspi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting articles
- Patent number 5,495,535
- Issue date Feb 27, 1996
- Orbotech Ltd.
- Zeev Smilansky
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM TO CALIBRATE A CAMERA CLOCK USING FLICKER
- Publication number 20210258561
- Publication date Aug 19, 2021
- EMZA VISUAL SENSE LTD
- ZEEV SMILANSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM TO CALIBRATE A CAMERA CLOCK USING FLICKER
- Publication number 20190281193
- Publication date Sep 12, 2019
- EMZA VISUAL SENSE LTD
- Zeev SMILANSKY
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MOTION DETECTION IN DIGITAL IMAGES AND A COMMUNICATION METHOD OF TH...
- Publication number 20190228532
- Publication date Jul 25, 2019
- EMZA VISUAL SENSE LTD
- Zeev SMILANSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM TO ALLOW OBJECT DETECTION IN VISUAL IMAGES BY TRA...
- Publication number 20190228275
- Publication date Jul 25, 2019
- EMZA VISUAL SENSE LTD
- Zeev SMILANSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pixel Design With Temporal Analysis Capabilities For Scene Interpre...
- Publication number 20130277539
- Publication date Oct 24, 2013
- EMZA VISUAL SENSE LTD.
- Zeev Smilansky
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Universal counting and measurement system
- Publication number 20100158386
- Publication date Jun 24, 2010
- EMZA Visual Sense Ltd.
- Zeev Smilansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Miniature autonomous agents for scene interpretation
- Publication number 20090074245
- Publication date Mar 19, 2009
- Zeev Smilansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE OPTICAL INPUT INSPECTION SYSTEM
- Publication number 20070263922
- Publication date Nov 15, 2007
- ORBOTECH LTD.
- SAKI ITZHAK HAKIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pixel based machine for patterned wafers
- Publication number 20050129303
- Publication date Jun 16, 2005
- APPLIED MATERIALS, INC.
- Zeev Smilansky
- G01 - MEASURING TESTING
Information Patent Application
Pixel based machine for patterned wafers
- Publication number 20050129302
- Publication date Jun 16, 2005
- APPLIED MATERIALS, INC.
- Zeev Smilansky
- G01 - MEASURING TESTING
Information Patent Application
Miniature autonomous agents for scene interpretation
- Publication number 20040131231
- Publication date Jul 8, 2004
- Zeev Smilansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and methods for the inspection of objects
- Publication number 20040126005
- Publication date Jul 1, 2004
- ORBOTECH LTD.
- Sharon Duvdevani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and methods for the inspection of objects
- Publication number 20040120571
- Publication date Jun 24, 2004
- ORBOTECH LTD.
- Sharon Duvdevani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for determining mass altering moiety in peptides
- Publication number 20040002118
- Publication date Jan 1, 2004
- Zeev Smilansky
- G01 - MEASURING TESTING
Information Patent Application
Pixel based machine for patterned wafers
- Publication number 20030063791
- Publication date Apr 3, 2003
- APPLIED MATERIALS, INC.
- Zeev Smilansky
- G01 - MEASURING TESTING
Information Patent Application
Pixel based machine for patterned wafers
- Publication number 20030063790
- Publication date Apr 3, 2003
- APPLIED MATERIALS, INC.
- Zeev Smilansky
- G01 - MEASURING TESTING
Information Patent Application
Multiple optical input inspection system
- Publication number 20020154810
- Publication date Oct 24, 2002
- ORBOTECH LTD.
- Saki Itzhak Hakim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for comparing signal arrays in digital images
- Publication number 20020102013
- Publication date Aug 1, 2002
- Zeev Smilansky
- G01 - MEASURING TESTING
Information Patent Application
Pixel based machine for patterned wafers
- Publication number 20020054704
- Publication date May 9, 2002
- APPLIED MATERIALS, INC.
- Zeev Smilansky
- G01 - MEASURING TESTING

Zeev Smilansky

Person

Patents Grantslast 30 patents

Method and system to calibrate a camera clock using flicker

Method and system to allow object detection in visual images by tra...

Motion detection in digital images and a communication method of th...

Pixel design with temporal analysis capabilities for scene interpre...

Universal counting and measurement system

Multiple optical input inspection system

Miniature autonomous agents for scene interpretation

Miniature autonomous agents for scene interpretation

Pixel based machine for patterned wafers

Apparatus and methods for the inspection of objects

Multiple optical input inspection system

Apparatus and methods for the inspection of objects

Apparatus and methods for the inspection of objects

Pixel based machine for patterned wafers

Pixel based machine for patterned wafers

Automatic visual inspection system

Pixel based machine for patterned wafers

Method for processing variable speed scenes for computer games

Automatic visual inspection system

Method of inspecting articles

Patents Applicationslast 30 patents

METHOD AND SYSTEM TO CALIBRATE A CAMERA CLOCK USING FLICKER

METHOD AND SYSTEM TO CALIBRATE A CAMERA CLOCK USING FLICKER

MOTION DETECTION IN DIGITAL IMAGES AND A COMMUNICATION METHOD OF TH...

METHOD AND SYSTEM TO ALLOW OBJECT DETECTION IN VISUAL IMAGES BY TRA...

Pixel Design With Temporal Analysis Capabilities For Scene Interpre...

Universal counting and measurement system

Miniature autonomous agents for scene interpretation

MULTIPLE OPTICAL INPUT INSPECTION SYSTEM

Pixel based machine for patterned wafers

Pixel based machine for patterned wafers

Miniature autonomous agents for scene interpretation

Apparatus and methods for the inspection of objects

Apparatus and methods for the inspection of objects

Method for determining mass altering moiety in peptides

Pixel based machine for patterned wafers

Pixel based machine for patterned wafers

Multiple optical input inspection system

Method for comparing signal arrays in digital images

Pixel based machine for patterned wafers