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Beijing, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for quantitative detection of gases
Patent number
11,761,887
Issue date
Sep 19, 2023
NATIONAL INSTITUTE OF METROLOGY, CHINA
Zejian Huang
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometry apparatus for ultraviolet light ionization of neu...
Patent number
10,163,618
Issue date
Dec 25, 2018
NATIONAL INSTITUTE OF METROLOGY CHINA
Xingchuang Xiong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Type rectangular ion trap device and method for ion storage and sep...
Patent number
9,679,759
Issue date
Jun 13, 2017
National Institute of Metrology, China
Xingchuang Xiong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap-based apparatus and method for analyzing and detecting bip...
Patent number
9,368,336
Issue date
Jun 14, 2016
BEIJING INSTITUTE OF TECHNOLOGY
Wei Xu
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
ION STORAGE SYSTEM AND METHOD BASED ON QUADRUPOLE-ION TRAP TANDEM M...
Publication number
20230094398
Publication date
Mar 30, 2023
NATIONAL INSTITUTE OF METROLOGY, CHINA
Shiying CHU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND METHOD FOR QUANTITATIVE DETECTION OF GASES
Publication number
20220307972
Publication date
Sep 29, 2022
NATIONAL INSTITUTE OF METROLOGY, CHINA
Zejian HUANG
G01 - MEASURING TESTING
Information
Patent Application
MASS SPECTROMETRY APPARATUS FOR ULTRAVIOLET LIGHT IONIZATION OF NEU...
Publication number
20180261443
Publication date
Sep 13, 2018
NATIONAL INSTITUTE OF METROLOGY CHINA
Xingchuang XIONG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NETWORKING MASS ANALYSIS METHOD AND DEVICE
Publication number
20170271137
Publication date
Sep 21, 2017
NATIONAL INSTITUTE OF METROLOGY, CHINA
You JIANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NEW TYPE RECTANGULAR ION TRAP DEVICE AND METHOD FOR ION STORAGE AND...
Publication number
20160293396
Publication date
Oct 6, 2016
NATIONAL INSTITUTE OF METROLOGY, CHINA
Xingchuang XIONG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION TRAP-BASED APPARATUS AND METHOD FOR ANALYZING AND DETECTING BIP...
Publication number
20150255265
Publication date
Sep 10, 2015
Beijing Institute of Technology
Wei Xu
H01 - BASIC ELECTRIC ELEMENTS